Introduction to X-Ray Spectrometric Analysis

  • Eugene P. Bertin

Table of contents

  1. Front Matter
    Pages i-xiv
  2. Eugene P. Bertin
    Pages 59-81
  3. Eugene P. Bertin
    Pages 121-157
  4. Eugene P. Bertin
    Pages 231-253
  5. Eugene P. Bertin
    Pages 255-278
  6. Eugene P. Bertin
    Pages 279-326
  7. Eugene P. Bertin
    Pages 327-391
  8. Eugene P. Bertin
    Pages 393-437
  9. Eugene P. Bertin
    Pages 439-473
  10. Back Matter
    Pages 475-485

About this book

Introduction

X-ray fluorescence spectrometry has been an established, widely practiced method of instrumental chemical analysis for about 30 years. However, although many colleges and universities offer full-semester courses in optical spectrometric methods of instrumental analysis and in x-ray dif­ fraction, very few offer full courses in x-ray spectrometric analysis. Those courses that are given are at the graduate level. Consequently, proficiency in this method must still be acquired by: self-instruction; on-the-job training and experience; "workshops" held by the x-ray instrument manu­ facturers; the one- or two-week summer courses offered by a few uni­ versities; and certain university courses in analytical and clinical chemistry, metallurgy, mineralogy. geology, ceramics. etc. that devote a small portion of their time to applications of x-ray spectrometry to those respective disciplines. Moreover, with all due respect to the books on x-ray spectrometric analysis now in print, in my opinion none is really suitable as a text or manual for beginners in the discipline. In 1968, when I undertook the writing of the first edition of my previous book, Principles and Practice of X-Ray Spectrometric Analysis,* my objective was to provide a student text. However, when all the material was compiled, I decided to provide a more comprehensive book, which was also lacking at that time. Although that book explains principles, instrumentation, and methods at the begin­ ner's level, this material is distributed throughout a mass of detail and more advanced material.

Keywords

Instrumental Analysis X-ray X-ray fluorescence ceramic chemical analysis chemistry clinical chemistry dispersion energy fluorescence metallurgy mineral mineralogy quantitative analysis spectrometry

Authors and affiliations

  • Eugene P. Bertin
    • 1
  1. 1.RCA LaboratoriesDavid Sarnoff Research CenterPrincetonUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4899-2204-5
  • Copyright Information Springer-Verlag US 1978
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-0-306-31091-1
  • Online ISBN 978-1-4899-2204-5
  • About this book