Relaxation in Complex Systems and Related Topics

  • Ian A. Campbell
  • Carlo Giovannella

Part of the NATO ASI Series book series (NSSB, volume 222)

Table of contents

  1. Front Matter
    Pages i-x
  2. Relaxation and Dynamics in Magnetic Systems

  3. Relaxation and Dynamics in Superconductors

    1. Front Matter
      Pages 79-79
    2. C. W. Hagen, R. Griessen
      Pages 81-88
    3. Dino Fiorani, Alberto M. Testa
      Pages 89-94
    4. Michael Reissner, Robert Ambrosch, Walter Steiner
      Pages 99-104

About this book


The aim of the workshop was to bring together specialists in various fields where non-exponential relaxation is observed in order to compare models and experimental results and to examine the general physical principles governing this type of behaviour. Non-exponential relaxation is found in extremely diverse physical systems all of which can be classified as complex. The form of the relaxation is generally parametrized using logarithmic, algebraic or stretched exponential decay forms. The conceptually simplest mechanism for the non-exponential decay is a spectrum of relaxation rates due to non-interacting units each of which relaxes with a different intrinsic time constant. Clear experimental examples can be given where for instance the relaxation of a collection of isolated polymer molecules leads to an overall stretched exponential decay. Non-exponential relaxation is observed in all strongly interacting complex systems (structural glasses, spin glasses, etc ... ) where each elementary unit is in interaction with many other units.


cluster complex system complex systems molecule particles system

Editors and affiliations

  • Ian A. Campbell
    • 1
  • Carlo Giovannella
    • 2
  1. 1.Université Paris-SudOrsayFrance
  2. 2.Università di Roma-Tor VergataRomeItaly

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag US 1990
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4899-2138-3
  • Online ISBN 978-1-4899-2136-9
  • Series Print ISSN 0258-1221
  • About this book