Elastic and Inelastic Scattering in Electron Diffraction and Imaging

  • Zhong Lin Wang

Table of contents

  1. Front Matter
    Pages i-xxvii
  2. Diffraction and Imaging of Elastically Scattered Electrons

  3. Diffraction and Imaging of Inelastically Scattered Electrons

  4. Back Matter
    Pages 417-448

About this book


Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros­ copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten­ sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J.


crystal diffraction elastic scattering electron diffraction electron microscopy electrons microscopy scanning transmission electron microscope scattering transmission electron microscopy

Authors and affiliations

  • Zhong Lin Wang
    • 1
  1. 1.School of Materials Science and EngineeringGeorgia Institute of TechnologyAtlantaUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4899-1579-5
  • Copyright Information Springer-Verlag US 1995
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4899-1581-8
  • Online ISBN 978-1-4899-1579-5
  • About this book