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Atomic Force Microscopy/Scanning Tunneling Microscopy 2

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Table of contents (28 chapters)

  1. Front Matter

    Pages i-ix
  2. Keynote Address

    1. Keynote Address

      • Michael F. Crommie
      Pages 1-3
  3. Semiconductor Characterization and Adsorbate Characterization

    1. Front Matter

      Pages 5-5
    2. A Microscopy for Our Time

      • Elinor Solit
      Pages 41-44
    3. Scanning Tunneling Microscopy and Atomic Force Microscopy of Chemical-Vapor-Deposition Diamond and Diamond-Like Carbon Thin Films

      • T. W. Mercer, D. L. Carroll, Yong Liang, D. Bonnell, T. A. Friedmann, M. P. Siegal et al.
      Pages 53-58
    4. Atomic Resolution Ultrahigh Vacuum Scanning Tunneling Microscopy of Diamond (100) Epitaxial Films

      • R. E. Stallcup, L. M. Villarreal, A. F. Aviles, J. M. Perez
      Pages 59-64
    5. Scanning Force Microscopy Characterization of Biopolymer Films: Gelatin on Mica

      • Greg Haugstad, Wayne L. Gladfelter, Elizabeth B. Weberg, Rolf T. Weberg, Timothy D. Weatherill
      Pages 65-73
  4. Biological and Chemical Nanostructure

    1. Front Matter

      Pages 91-91
    2. Visualization of the Surface Degradation of Biomedical Polymers in Situ with an Atomic Force Microscope

      • K. M. Shakesheff, M. C. Davies, A. Domb, C. J. Roberts, A. J. Shard, S. J. B. Tendler et al.
      Pages 93-98
  5. New Developments in AFM/STM

    1. Front Matter

      Pages 125-125
    2. Investigations on the Topographic and Spectroscopic Imaging by the Scanning Tunneling Microscope

      • M. Hietschold, O. Pester, D. Porezag, M. Röder, H. Sbosny, K. Walzer et al.
      Pages 127-135
    3. Observing Reactions via Flow Injection Scanning Tunneling Microscopy

      • James D. Noll, Paul G. Van Patten, M. L. Myrick
      Pages 137-146

About this book

This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.

Editors and Affiliations

  • Natick Research, Development and Engineering Center, U.S. Army Soldier Systems Command, Natick, USA

    Samuel H. Cohen, Marcia L. Lightbody

Bibliographic Information

Buy it now

Buying options

eBook USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access