Conceptual Design of Multichip Modules and Systems

  • Peter A. Sandborn
  • Hector Moreno

Table of contents

  1. Front Matter
    Pages i-xv
  2. Peter A. Sandborn, Hector Moreno
    Pages 1-22
  3. Peter A. Sandborn, Hector Moreno
    Pages 23-54
  4. Peter A. Sandborn, Hector Moreno
    Pages 55-188
  5. Peter A. Sandborn, Hector Moreno
    Pages 189-203
  6. Peter A. Sandborn, Hector Moreno
    Pages 205-243
  7. Back Matter
    Pages 245-259

About this book

Introduction

Conceptual Design of Multichip Modules and Systems treats activities which take place at the conceptual and specification level of the design of complex multichip systems. These activities include the formalization of design knowledge (information modeling), tradeoff analysis, partitioning, and decision process capture. All of these functions occur prior to the traditional CAD activities of synthesis and physical design.
Inherent in the design of electronic modules are tradeoffs which must be understood before feasible technology, material, process, and partitioning choices can be selected. The lack of a complete set of technology information is an especially serious problem in the packaging and interconnect field since the number of technologies, process, and materials is substantial and selecting optimums is arduous and non-trivial if one truly wants a balance in cost and performance. Numerous tradeoff and design decisions have to be made intelligently and quickly at the beginning of the design cycle before physical design work begins. These critical decisions, made within the first 10% of the total design cycle, ultimately define up to 80% of the final product cost.
Conceptual Design of Multichip Modules and Systems lays the groundwork for concurrent estimation level analysis including size, routing, electrical performance, thermal performance, cost, reliability, manufacturability, and testing. It will be useful both as a reference for system designers and as a text for those wishing to gain a perspective on the nature of packaging and interconnect design, concurrent engineering, computer-aided design, and system synthesis.

Keywords

computer interconnect material modeling testing

Authors and affiliations

  • Peter A. Sandborn
    • 1
  • Hector Moreno
    • 1
  1. 1.Microelectronics and Computer Technology Corporation (MCC)USA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4757-4841-3
  • Copyright Information Springer-Verlag US 1994
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4419-5137-3
  • Online ISBN 978-1-4757-4841-3
  • Series Print ISSN 0893-3405
  • About this book