Advanced Computing in Electron Microscopy

  • Earl J. Kirkland

Table of contents

  1. Front Matter
    Pages i-ix
  2. Earl J. Kirkland
    Pages 1-3
  3. Earl J. Kirkland
    Pages 5-18
  4. Earl J. Kirkland
    Pages 19-39
  5. Earl J. Kirkland
    Pages 41-62
  6. Earl J. Kirkland
    Pages 63-97
  7. Earl J. Kirkland
    Pages 99-132
  8. Earl J. Kirkland
    Pages 133-155
  9. Earl J. Kirkland
    Pages 157-183
  10. Back Matter
    Pages 185-250

About this book

Introduction

pending

Keywords

Approximation Interpolation Potential computer computer simulation electron microscopy fast fourier projection theorem fast fourier transform microscopy multislice methods scanning transmission electron microscope simulation theory of electron

Authors and affiliations

  • Earl J. Kirkland
    • 1
  1. 1.Cornell UniversityIthacaUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4757-4406-4
  • Copyright Information Springer-Verlag US 1998
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4757-4408-8
  • Online ISBN 978-1-4757-4406-4
  • About this book