Electron Backscatter Diffraction in Materials Science

1. Front Matter

   Pages i-xvi

   PDF

2. The Development of Automated Diffraction in Scanning and Transmission Electron Microscopy

   • David J. Dingley

   Pages 1-18

3. Theoretical Framework for Electron Backscatter Diffraction

   • Valerie Randle

   Pages 19-30

4. Representations of Texture in Orientation Space

   • Krishna Rajan

   Pages 31-38

5. Rodrigues-Frank Representations of Crystallographic Texture

   • Krishna Rajan

   Pages 39-50

6. Fundamentals of Automated EBSD

   • Stuart I. Wright

   Pages 51-64

7. Studies on the Accuracy of Electron Backscatter Diffraction Measurements

   • Melik C. Demirel, Bassem S. El-Dasher, Brent L. Adams, Anthony D. Rollett

   Pages 65-74

8. Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope

   • Joseph R. Michael

   Pages 75-89

9. Three-Dimensional Orientation Imaging

   • Dorte Juul Jensen

   Pages 91-104

10. Automated Electron Backscatter Diffraction: Present State and Prospects

    • Robert A. Schwarzer

    Pages 105-122

11. EBSD: Buying a System

    • Alwyn Eades

    Pages 123-126

12. Hardware and Software Optimization for Orientation Mapping and Phase Identification

    • Patrick P. Camus

    Pages 127-134

13. An Automated EBSD Acquisition and Processing System

    • Pierre Rolland, Keith G. Dicks

    Pages 135-140

14. Advanced Software Capabilities for Automated EBSD

    • Stuart I. Wright, David P. Field, David J. Dingley

    Pages 141-152

15. Strategies for Analyzing EBSD Datasets

    • Wayne E. King, James S. Stölken, Mukul Kumar, Adam J. Schwartz

    Pages 153-170

16. Structure-Properties Relations: EBSD-Based Material-Sensitive Design

    • Brent L. Adams, Ben Henrie, Larry Howell, Richard Balling

    Pages 171-180

17. Use of EBSD Data in Mesoscale Numerical Analyses

    • Richard Becker, Hasso Weiland

    Pages 181-198

18. Characterization of Deformed Microstructures

    • David P. Field, Hasso Weiland

    Pages 199-212

19. Anisotropic Plasticity Modeling Incorporating EBSD Characterization of Tantalum and Zirconium

    • John F. Bingert, Thomas A. Mason, George C. Kaschner, Paul J. Maudlin, George T. Gray III

    Pages 213-229

20. Measuring Strains Using Electron Backscatter Diffraction

    • Angus J. Wilkinson

    Pages 231-246

Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIM™) and Automated Crystal Orientation Mapping (ACOM).

• EBSD explained
• backscattered electron generation
• crystal
• deformation
• diffraction
• elastic strains
• electron microscopy
• grain boundaries
• materials characterization
• materials characterization technique
• materials science
• microscopy
• plastic strains;

• Lawrence Livermore National Laboratory, Livermore, USA

  Adam J. Schwartz, Mukul Kumar

• Brigham Young University, Provo, USA

  Brent L. Adams