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  • © 2000

Electron Backscatter Diffraction in Materials Science

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Table of contents (25 chapters)

  1. Front Matter

    Pages i-xvi
  2. Fundamentals of Automated EBSD

    • Stuart I. Wright
    Pages 51-64
  3. Studies on the Accuracy of Electron Backscatter Diffraction Measurements

    • Melik C. Demirel, Bassem S. El-Dasher, Brent L. Adams, Anthony D. Rollett
    Pages 65-74
  4. Three-Dimensional Orientation Imaging

    • Dorte Juul Jensen
    Pages 91-104
  5. EBSD: Buying a System

    • Alwyn Eades
    Pages 123-126
  6. An Automated EBSD Acquisition and Processing System

    • Pierre Rolland, Keith G. Dicks
    Pages 135-140
  7. Advanced Software Capabilities for Automated EBSD

    • Stuart I. Wright, David P. Field, David J. Dingley
    Pages 141-152
  8. Strategies for Analyzing EBSD Datasets

    • Wayne E. King, James S. Stölken, Mukul Kumar, Adam J. Schwartz
    Pages 153-170
  9. Structure-Properties Relations: EBSD-Based Material-Sensitive Design

    • Brent L. Adams, Ben Henrie, Larry Howell, Richard Balling
    Pages 171-180
  10. Use of EBSD Data in Mesoscale Numerical Analyses

    • Richard Becker, Hasso Weiland
    Pages 181-198
  11. Characterization of Deformed Microstructures

    • David P. Field, Hasso Weiland
    Pages 199-212
  12. Anisotropic Plasticity Modeling Incorporating EBSD Characterization of Tantalum and Zirconium

    • John F. Bingert, Thomas A. Mason, George C. Kaschner, Paul J. Maudlin, George T. Gray III
    Pages 213-229

About this book

Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIM™) and Automated Crystal Orientation Mapping (ACOM).

Keywords

  • EBSD explained
  • backscattered electron generation
  • crystal
  • deformation
  • diffraction
  • elastic strains
  • electron microscopy
  • grain boundaries
  • materials characterization
  • materials characterization technique
  • materials science
  • microscopy
  • plastic strains;

Editors and Affiliations

  • Lawrence Livermore National Laboratory, Livermore, USA

    Adam J. Schwartz, Mukul Kumar

  • Brigham Young University, Provo, USA

    Brent L. Adams

Bibliographic Information

Buy it now

Buying options

eBook USD 74.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever

Tax calculation will be finalised at checkout

Other ways to access