Band Structure Engineering in Semiconductor Microstructures

  • R. A. Abram
  • M. Jaros

Part of the NATO ASI Series book series (NSSB, volume 189)

Table of contents

  1. Front Matter
    Pages i-xi
  2. Electronic Structure, Band Offsets and Stability

  3. Transport Properties

    1. L. Eaves, F. W. Sheard, G. A. Toombs
      Pages 149-166
    2. M. Heiblum, K. Seo, H. P. Meier, T. W. Hickmott
      Pages 167-176
    3. William R. Frensley
      Pages 177-185
    4. R. J. Malik, A. F. J. Levi, B. F. Levine, R. C. Miller, D. V. Lang, L. C. Hopkins et al.
      Pages 217-223

About this book


This volume contains the proceedings of the NATO Advanced Research Workshop on Band Structure Engineering in Semiconductor Microstructures held at Il Ciocco, Castelvecchio Pascali in Tuscany between 10th and 15th April 1988. Research on semiconductor microstructures has expanded rapidly in recent years as a result of developments in the semiconductor growth and device fabrication technologies. The emergence of new semiconductor structures has facilitated a number of approaches to producing systems with certain features in their electronic structure which can lead to useful or interesting properties. The interest in band structure engineering has stimd ated a variety of physical investigations and nove 1 device concepts and the field now exhibits a fascinating interplay betwepn pure physics and device technology. Devices based on microstruc­ tures are useful vehicles for fundamental studies but also new device ideas require a thorough understanding of the basic physics. Around forty researchers gathered at I1 Ciocco in the Spring of 1988 to discuss band structure engineering in semiconductor microstructures.


band structure electronic structure semiconductor

Editors and affiliations

  • R. A. Abram
    • 1
  • M. Jaros
    • 2
  1. 1.School of Engineering and Applied ScienceUniversity of DurhamDurhamUK
  2. 2.Department of Theoretical PhysicsUniversity of Newcastle upon TyneNewcastle upon TyneUK

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag US 1989
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4757-0772-4
  • Online ISBN 978-1-4757-0770-0
  • Series Print ISSN 0258-1221
  • About this book