Interpretive Techniques for Microstructural Analysis

  • James L. McCall
  • P. M. French

Table of contents

  1. Front Matter
    Pages i-ix
  2. L. E. Samuels
    Pages 17-42
  3. R. S. Crouse, R. J. Gray, B. C. Leslie
    Pages 43-64
  4. M. Nahmmacher
    Pages 65-78
  5. H. E. Rosenberger
    Pages 79-104
  6. Anton F. Mohrnheim
    Pages 117-126
  7. Robert Z. Muggli, Walter C. McCrone
    Pages 127-143
  8. J. H. Evans
    Pages 145-168
  9. Mary E. Cox
    Pages 169-182
  10. Back Matter
    Pages 195-201

About this book

Introduction

In recent years microstructural analysis has been a rapidly changing field of scien­ tific endeavor. No longer are the efforts of the microstructural analysts (sometimes referred to as metallographers, materialographers, ceramographers, and similar desig­ nations) limited to the tasks of polishing, etching, and photographing specimens of materials. The performance demanded of materials used for many current applica­ tions requires much more complete characterizations than were possible only a scant few years ago. Although the individuals who have been expected to develop new and improved techniques to permit these required characterizations have been severely challenged, in large part they have met the challenge. In view of the many new developments in the field of microstructural analysis and recognizing the requirements to communicate these developments to the wide audience that might make use of them, the American Society for Metals and the In­ ternational Metallographic Society joined forces to co-sponsor a symposium that was intended to bring participants and attendees up to date on the subject "Inter­ pretive Techniques for Microstructural Analysis". This symposium was held in Min­ neapolis, Minnesota, USA, June 29 and 30, 1975. It followed two earlier symposia co-sponsored by the same two societies on other subjects of current interest to the metallographic community, Microstructural Analysis - Tools and Techniques, 1972, and Metallographic Specimen Preparation - Optical and Electron Micros­ copy, 1973.

Keywords

USA development material materials metals microscopy preparation structural analysis

Editors and affiliations

  • James L. McCall
    • 1
  • P. M. French
    • 2
  1. 1.Battelle-Columbus LaboratoriesColumbusUSA
  2. 2.Westinghouse Electric CorporationCheswickUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4684-2370-9
  • Copyright Information Springer-Verlag US 1977
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4684-2372-3
  • Online ISBN 978-1-4684-2370-9
  • About this book