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Table of contents (14 chapters)
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Front Matter
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Die Level Testing
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Simulation Techniques for MCMs
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Back Matter
About this book
Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain.
Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).
Editors and Affiliations
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Logic Vision, Inc., USA
Yervant Zorian
Bibliographic Information
Book Title: Multi-Chip Module Test Strategies
Editors: Yervant Zorian
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/978-1-4615-6107-1
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1997
Hardcover ISBN: 978-0-7923-9920-9Published: 31 May 1997
Softcover ISBN: 978-1-4613-7798-6Published: 04 October 2012
eBook ISBN: 978-1-4615-6107-1Published: 06 December 2012
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: 167