Reliability, Yield, and Stress Burn-In

A Unified Approach for Microelectronics Systems Manufacturing & Software Development

  • Authors
  • Way Kuo
  • Wei-Ting Kary Chien
  • Taeho Kim

Table of contents

  1. Front Matter
    Pages i-xxvi
  2. Way Kuo, Wei-Ting Kary Chien, Taeho Kim
    Pages 1-24
  3. Way Kuo, Wei-Ting Kary Chien, Taeho Kim
    Pages 25-44
  4. Way Kuo, Wei-Ting Kary Chien, Taeho Kim
    Pages 45-64
  5. Way Kuo, Wei-Ting Kary Chien, Taeho Kim
    Pages 65-91
  6. Way Kuo, Wei-Ting Kary Chien, Taeho Kim
    Pages 93-123
  7. Way Kuo, Wei-Ting Kary Chien, Taeho Kim
    Pages 125-175
  8. Way Kuo, Wei-Ting Kary Chien, Taeho Kim
    Pages 177-213
  9. Way Kuo, Wei-Ting Kary Chien, Taeho Kim
    Pages 215-241
  10. Way Kuo, Wei-Ting Kary Chien, Taeho Kim
    Pages 243-259
  11. Way Kuo, Wei-Ting Kary Chien, Taeho Kim
    Pages 261-279
  12. Way Kuo, Wei-Ting Kary Chien, Taeho Kim
    Pages 281-304
  13. Way Kuo, Wei-Ting Kary Chien, Taeho Kim
    Pages 305-332
  14. Back Matter
    Pages 333-394

About this book

Introduction

The international market is very competitive for high-tech manufacturers to­ day. Achieving competitive quality and reliability for products requires leader­ ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de­ sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur­ ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in­ dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.

Keywords

complexity defects design development electronics manufacturing microelectronics modeling production simulation software software development system design

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4615-5671-8
  • Copyright Information Kluwer Academic Publishers 1998
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-0-7923-8107-5
  • Online ISBN 978-1-4615-5671-8
  • About this book