Overview
Part of the book series: The Springer International Series in Engineering and Computer Science (SECS, volume 208)
Access this book
Tax calculation will be finalised at checkout
Other ways to access
Table of contents (8 chapters)
Keywords
About this book
Authors and Affiliations
Bibliographic Information
Book Title: Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Authors: José Pineda Gyvez
Series Title: The Springer International Series in Engineering and Computer Science
DOI: https://doi.org/10.1007/978-1-4615-3158-6
Publisher: Springer New York, NY
-
eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1993
Hardcover ISBN: 978-0-7923-9306-1Published: 31 December 1992
Softcover ISBN: 978-1-4613-6383-5Published: 23 February 2014
eBook ISBN: 978-1-4615-3158-6Published: 27 November 2013
Series ISSN: 0893-3405
Edition Number: 1
Number of Pages: XXIV, 167
Number of Illustrations: 48 b/w illustrations
Topics: Electrical Engineering