Advertisement

Statistical Models and Control Charts for High-Quality Processes

  • M Xie
  • T N Goh
  • V Kuralmani

Table of contents

  1. Front Matter
    Pages i-xv
  2. M. Xie, T. N. Goh, V. Kuralmani
    Pages 1-20
  3. M. Xie, T. N. Goh, V. Kuralmani
    Pages 21-38
  4. M. Xie, T. N. Goh, V. Kuralmani
    Pages 39-65
  5. M. Xie, T. N. Goh, V. Kuralmani
    Pages 67-75
  6. M. Xie, T. N. Goh, V. Kuralmani
    Pages 77-109
  7. M. Xie, T. N. Goh, V. Kuralmani
    Pages 111-143
  8. M. Xie, T. N. Goh, V. Kuralmani
    Pages 145-176
  9. M. Xie, T. N. Goh, V. Kuralmani
    Pages 177-204
  10. M. Xie, T. N. Goh, V. Kuralmani
    Pages 205-235
  11. M. Xie, T. N. Goh, V. Kuralmani
    Pages 237-261
  12. Back Matter
    Pages 263-276

About this book

Introduction

Control charts are widely used in industry to monitor processes that are far from Zero-Defect (ZD), and their use in a near Zero-Defect manufacturing environment poses many problems. This book presents techniques of using control charts for high-quality processes, and some recent findings and applications of statistical control chart techniques for ZD processes are presented.

A powerful technique based on counting of the cumulative conforming (CCC) items between two nonconforming ones is discussed in detail. Extensions of the CCC chart are described, as well as applications of cumulative sum and exponentially weighted moving average techniques to CCC-related data, multivariate methods, economic design of control chart procedures, and modeling and analysis of trended but regularly adjusted processes.

Many examples, charts, and procedures, are presented throughout the book, and references are provided for those interested in exploring the details. A number of questions and issues are posed for further investigations. Researchers and students may find many ideas in this book useful in their academic work, as a foundation is laid for the exploration of many further theoretical and practical issues.

Keywords

Statistical Control modeling probability statistical models

Authors and affiliations

  • M Xie
    • 1
  • T N Goh
    • 1
  • V Kuralmani
    • 2
  1. 1.Dept of Industrial and Systems EngineeringNational University of Singapore Kent Ridge CrescentSingapore
  2. 2.Institute of High Performance ComputingSingapore

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4615-1015-4
  • Copyright Information Springer Science+Business Media New York 2002
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4613-5352-2
  • Online ISBN 978-1-4615-1015-4
  • Buy this book on publisher's site