Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

  • Ruijing Shen
  • Sheldon X.-D. Tan
  • Hao Yu

Table of contents

  1. Front Matter
    Pages i-xxix
  2. Fundamentals

    1. Front Matter
      Pages 1-1
    2. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
      Pages 3-14
    3. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
      Pages 15-36
  3. Statistical Full-Chip Power Analysis

    1. Front Matter
      Pages 37-37
    2. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
      Pages 39-54
    3. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
      Pages 55-63
    4. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
      Pages 65-82
    5. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
      Pages 83-92
    6. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
      Pages 93-103
  4. Variational On-Chip Power Delivery Network Analysis

    1. Front Matter
      Pages 105-105
    2. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
      Pages 107-126
    3. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
      Pages 127-144
    4. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
      Pages 145-159
  5. Statistical Interconnect Modeling and Extractions

    1. Front Matter
      Pages 161-161
    2. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
      Pages 163-182
    3. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
      Pages 183-208
    4. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
      Pages 209-218
  6. Statistical Analog and Yield Analysis and Optimization Techniques

    1. Front Matter
      Pages 219-219
    2. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
      Pages 221-233

About this book

Introduction

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become imperative for the successful design of VLSI chips.

This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. 

  • Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;
  • Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;
  • Presents analysis of each algorithm with practical applications in the context of real circuit design;
  • Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. 

  • Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;
  • Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;
  • Presents analysis of each algorithm with practical applications in the context of real circuit design;
  • Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. 

Keywords

Integrated Circuits and Systems Nanometer VLSI Design Statistical Analysis for Nanometer VLSI VLSI Design Variation-aware Integrated Circuit Design

Authors and affiliations

  • Ruijing Shen
    • 1
  • Sheldon X.-D. Tan
    • 2
  • Hao Yu
    • 3
  1. 1., Dept. of Electrical EngineeringUniversity of CaliforniaRiversideUSA
  2. 2., Dept. of Electrical EngineeringUniversity of CaliforniaRiversideUSA
  3. 3., Department of Electrical and ElectronicNanyang Technological UniversitySingaporeSingapore

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4614-0788-1
  • Copyright Information Springer Science+Business Media, LLC 2012
  • Publisher Name Springer, Boston, MA
  • eBook Packages Engineering
  • Print ISBN 978-1-4614-0787-4
  • Online ISBN 978-1-4614-0788-1
  • About this book