Managing Temperature Effects in Nanoscale Adaptive Systems

  • David Wolpert
  • Paul Ampadu

Table of contents

  1. Front Matter
    Pages i-xxii
  2. David Wolpert, Paul Ampadu
    Pages 1-13
  3. David Wolpert, Paul Ampadu
    Pages 15-33
  4. David Wolpert, Paul Ampadu
    Pages 35-61
  5. David Wolpert, Paul Ampadu
    Pages 63-92
  6. David Wolpert, Paul Ampadu
    Pages 93-123
  7. David Wolpert, Paul Ampadu
    Pages 141-167
  8. David Wolpert, Paul Ampadu
    Pages 169-170
  9. Back Matter
    Pages 171-174

About this book

Introduction

This book discusses new techniques for detecting, controlling, and exploiting the impacts of temperature variations on nanoscale circuits and systems.  It provides a holistic discussion of temperature management, including physical phenomena (reversal of the MOSFET temperature dependence) that have recently become problematic, along with circuit techniques for detecting, controlling, and adapting to these phenomena. A detailed discussion is also included of the general aspects of thermal-aware system design and management of temperature-induced faults. A new sensor system is described that can determine the temperature dependence as well as the operating temperature to improve system reliability.  A new method is presented to control a circuit’s temperature dependence by individually tuning pull-up and pull-down networks to their temperature-insensitive operating points. This method extends the range of supply voltages that can be made temperature-insensitive, achieving insensitivity at nominal voltage for the first time.

  • Provides background on aspects of nanoscale circuits and systems that are affected by temperature, how they are affected by temperature, and what systems can be used to reduce these effects;
  • Describes chip implementation details of a new type of temperature sensor that can ensure reliable operation across multiple temperature dependences;
  • Includes new methods for achieving temperature insensitivity with example circuits and fabrication-related details such as process variation management.
     
     
     

 

 
 


 

Keywords

Embedded Systems Integrated Circuit Design On-chip interconnect Temperature in Semiconductors Temperature-Induced Errors Thermal management in Integrated Circuits Variation-Tolerant Adaptive Voltage Systems

Authors and affiliations

  • David Wolpert
    • 1
  • Paul Ampadu
    • 2
  1. 1.University of RochesterRochesterUSA
  2. 2.University of RochesterRochesterUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4614-0748-5
  • Copyright Information Springer Science+Business Media, LLC 2012
  • Publisher Name Springer, New York, NY
  • eBook Packages Engineering
  • Print ISBN 978-1-4614-0747-8
  • Online ISBN 978-1-4614-0748-5
  • About this book