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Optical Measurements, Modeling, and Metrology, Volume 5

Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics

  • Tom Proulx

Table of contents

  1. Front Matter
    Pages i-x
  2. Kazuhisa Sato, Kenta Aoyagi, Toyohiko J. Konno
    Pages 1-9
  3. C. Landron, E. Maire, J. Adrien, O. Bouaziz
    Pages 11-18
  4. T. F. Morgeneyer, L. Helfen, I. Sinclair, F. Hild, H. Proudhon, F. Xu et al.
    Pages 19-25
  5. D. Fabrègue, C. Landron, C. Béal, X. Kleber, E. Maire, M. Bouzekri
    Pages 27-32
  6. Loïc Courtois, Eric Maire, Michel Perez, Yves Brechet, David Rodney
    Pages 33-38
  7. L. Laiarinandrasana, T. F. Morgeneyer, H. Proudhon
    Pages 47-54
  8. Nicolas Vanderesse, Jean-Yves Buffiere, Eric Maire, Amaury Chabod
    Pages 55-61
  9. Aurélien Buteri, Jean-Yves Buffière, Julien Réthoré, Damien Fabrègue, Elodie Perrin, Sylvain Henry
    Pages 63-67
  10. E. Maire, M. Persson Gulda, N. Nakamura, K. Jensen, E. Margolis, C. Friedsam et al.
    Pages 69-74
  11. Sanichiro Yoshida, Diwas Bhattarai, Tatsuo Okiyama, Kensuke Ichinose
    Pages 75-81
  12. Motoaki Morita, Osamu Umezawa
    Pages 91-96
  13. S. Yoneyama, S. Arikawa, Y. Kobayashi
    Pages 109-118
  14. M. C. Frassanito, L. Lamberti, A. Boccaccio, C. Pappalettere
    Pages 119-124
  15. Antti H. Huhtala, Sven Bossuyt
    Pages 125-130
  16. Marco Sasso, Gianluca Chiappini, Marco Rossi, Giacomo Palmieri
    Pages 131-139
  17. D. Delpueyo, M. Grédiac, X. Balandraud, C. Badulescu
    Pages 181-186
  18. C. A. Sciammarella, A. Boccaccio, M. C. Frassanito, L. Lamberti, C. Pappalettere
    Pages 209-217
  19. Ellery Harrington, Cosme Furlong, John J. Rosowski, Jeffrey T. Cheng
    Pages 219-228
  20. J. M. Flores-Moreno, Cosme Furlong, John J. Rosowski
    Pages 229-234
  21. Michael Zervas, Cosme Furlong, Ellery Harrington, Ivo Dobrev
    Pages 235-241
  22. A. Boccaccio, C. Casavola, L. Lamberti, C. Pappalettere
    Pages 249-256
  23. K. Genovese, L. Casaletto, Y-U. Lee, J. D. Humphrey
    Pages 257-263
  24. Yohei Oura, Motoharu Fujigaki, Akihiro Masaya, Yoshiharu Morimoto
    Pages 285-292
  25. Marco Rossi, Rachid Cheriguene, Fabrice Pierron, Pasqual Forquin
    Pages 299-306
  26. Troy Lundstrom, Christopher Niezrecki, Peter Avitabile
    Pages 307-321
  27. Makiko Nakabo, Motoharu Fujigaki, Yoshiharu Morimoto, Yuji Sasatani, Hiroyuki Kondo, Takuya Hara
    Pages 323-330
  28. S. Ekwaro-Osire, I. Durukan, F. M. Alemayehu, J. F. Cardenas-Garcia
    Pages 331-335
  29. Michael S. Waters, Bin Yang, Nancy J. Lin, Sheng Lin-Gibson
    Pages 337-344
  30. H. M. Ngwangwa, P. S. Heyns, H. G. A. Breytenbach, P. S. Els
    Pages 345-357
  31. Jing-Fung Lin, Jiann-Shing Jeng, Wen-Ruey Chen
    Pages 359-364
  32. Y. Sakanashi, S. Gungor, P. J. Bouchard
    Pages 371-378
  33. Fu-pen Chiang, Jian-dong Yu
    Pages 393-399
  34. Farhad Mortazvi, Martin Lévesque, Isabelle Villemure
    Pages 407-413

About these proceedings

Introduction

Optical Measurements, Modeling and, Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference & Exposition on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials; MEMS and Nanotechnology; Experimental and Applied Mechanics, Thermomechanics and Infra-Red Imaging, and Engineering Applications of Residual Stress.

Editors and affiliations

  • Tom Proulx
    • 1
  1. 1.Society for Experimental MechanicsBETHELUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4614-0228-2
  • Copyright Information The Society for Experimental Mechanics, Inc. 2011 2011
  • Publisher Name Springer, New York, NY
  • eBook Packages Engineering
  • Print ISBN 978-1-4614-0227-5
  • Online ISBN 978-1-4614-0228-2
  • Series Print ISSN 2191-5644
  • Series Online ISSN 2191-5652
  • Buy this book on publisher's site