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Residual Stress

Measurement by Diffraction and Interpretation

  • Ismail C. Noyan
  • Jerome B. Cohen

Part of the Materials Research and Engineering book series (MATERIALS)

Table of contents

  1. Front Matter
    Pages I-X
  2. Ismail C. Noyan, Jerome B. Cohen
    Pages 1-12
  3. Ismail C. Noyan, Jerome B. Cohen
    Pages 13-46
  4. Ismail C. Noyan, Jerome B. Cohen
    Pages 47-74
  5. Ismail C. Noyan, Jerome B. Cohen
    Pages 75-116
  6. Ismail C. Noyan, Jerome B. Cohen
    Pages 117-163
  7. Ismail C. Noyan, Jerome B. Cohen
    Pages 211-229
  8. Ismail C. Noyan, Jerome B. Cohen
    Pages 230-247
  9. Back Matter
    Pages 248-276

About this book

Keywords

Absorption Fitting Goniometer Hardware Industrie Information Kristallographie Monochromator Peak Profil Röntgenstrahlung Service Software Temperatur deformation CIM Filter Fundament Phase Transformation

Authors and affiliations

  • Ismail C. Noyan
    • 1
  • Jerome B. Cohen
    • 2
  1. 1.Thomas J. Watson Research CenterIBMYorktown HeightsUSA
  2. 2.Dept. of Materials Science and Engineering, The Technological InstituteNorthwestern UniversityEvanstonUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4613-9570-6
  • Copyright Information Springer-Verlag New York Inc. 1987
  • Publisher Name Springer, New York, NY
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4613-9571-3
  • Online ISBN 978-1-4613-9570-6
  • Buy this book on publisher's site