Computer Vision for Electronics Manufacturing

  • L. F. Pau

Table of contents

  1. Front Matter
    Pages i-xvi
  2. Introduction and Organization of the Book

  3. Applications and Systems Aspects

    1. Front Matter
      Pages 5-5
    2. L. F. Pau
      Pages 7-31
    3. L. F. Pau
      Pages 105-115
    4. L. F. Pau
      Pages 117-125
    5. L. F. Pau
      Pages 127-131
    6. L. F. Pau
      Pages 133-139
    7. L. F. Pau
      Pages 141-160
    8. L. F. Pau
      Pages 161-185
  4. Vision Algorithms for Electronics Manufacturing

    1. Front Matter
      Pages 207-207
    2. L. F. Pau
      Pages 207-213
    3. L. F. Pau
      Pages 215-219
    4. L. F. Pau
      Pages 221-231
    5. L. F. Pau
      Pages 233-241

About this book

Introduction

DEFECT PROPORTION OF DETECTION INITIAL RATE DETECTION RATE INSPECTOR 3 COMPLEXITY OF TIMES PAN OF PERFORMING o~ ________________________ o~ ______________________ __ -;. INSPECTION TASK -;. VISUAL INSPECTION Fagure 1. Trends in relations between the complexity of inspection tasks, defect detection rates (absolute and relative), and inspection time. Irrespective of the necessities described above, and with the excep­ tion of specific generic application systems (e.g., bare-board PCB inspection, wafer inspection, solder joint inspection, linewidth measure­ ment), vision systems are still not found frequently in today's electronics factories. Besides cost, some major reasons for this absence are: 1. The detection robustness or accuracy is still insufficient. 2. The total inspection time is often too high, although this can frequently be attributed to mechanical handling or sensing. 3. There are persistent gaps among process engineers, CAD en­ gineers, manufacturing engineers, test specialists, and computer vision specialists, as problems dominate the day-to-day interac­ tions and prevent the establishment of trust. 4. Computer vision specialists sometimes still believe that their contributions are universal, so that adaptation to each real problem becomes tedious, or stumbles over the insufficient availabIlity of multidisciplinary expertise. Whether we like it or not, we must still use appropriate sensors, lighting, and combina­ tions of algorithms for each class of applications; likewise, we cannot design mechanical handling, illumination, and sensing in isolation from each other.

Keywords

Sensor Signal Wafer algorithms circuit complexity computer computer vision electronics image processing integrated circuit logic manufacturing model transmission

Authors and affiliations

  • L. F. Pau
    • 1
    • 2
  1. 1.Technical University of DenmarkLyngbyDenmark
  2. 2.University of TokyoTokyoJapan

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4613-0507-1
  • Copyright Information Springer-Verlag US 1990
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4612-7841-2
  • Online ISBN 978-1-4613-0507-1
  • About this book