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Microstructure of Fine-Grained Sediments

From Mud to Shale

  • Richard H. Bennett
  • William R. Bryant
  • Matthew H. Hulbert
  • W. A. Chiou
  • R. W. Faas
  • J. Kasprowicz
  • H. Li
  • T. Lomenick
  • N. R. O’Brien
  • S. Pamukcu
  • P. Smart
  • C. E. Weaver
  • T. Yamamoto

Part of the Frontiers in Sedimentary Geology book series (SEDIMENTARY)

Table of contents

  1. Front Matter
    Pages i-xxii
  2. Basic Clay Microstructure

    1. Front Matter
      Pages 1-1
    2. Microstructure: Signatures

      1. Richard W. Faas, Neal R. O’Brien
        Pages 3-4
      2. Richard H. Bennett, Neal R. O’Brien, Matthew H. Hulbert
        Pages 5-32
      3. S. A. Kuehl, T. M. Hariu, M. W. Sanford, C. A. Nittrouer, D. J. DeMaster
        Pages 33-45
      4. William R. Bryant, Richard H. Bennett, Patti J. Burkett, F. R. Rack
        Pages 73-92
      5. Jane Schoonmaker Tribble, Fred T. Mackenzie, Jozsef Urmos
        Pages 93-99
      6. David K. Davies, William R. Bryant, Richard K. Vessell, Patti J. Burkett
        Pages 109-119
    3. Environmental Processes: A Continuum

      1. William R. Bryant
        Pages 123-124
      2. W. B. Dade, A. R. M. Nowell, P. A. Jumars
        Pages 161-165
      3. Mark A. Ross, Ashish J. Mehta
        Pages 185-191
      4. Elliott Taylor, Patti J. Burkett, Jeri D. Wackler, John N. Leonard
        Pages 213-228
      5. Kathleen A. Dadey, Margaret Leinen, Armand J. Silva
        Pages 229-236
  3. Applied Clay Microstructure

    1. Front Matter
      Pages 237-237
    2. Modeling—Past and Present: New Directions

      1. Jos Cenens, Robert A. Schoonheydt, Frans C. De Schryver
        Pages 255-258
      2. D. J. A. Williams, P. R. Williams
        Pages 267-271
      3. F. Tom Chang, G. P. Lennon, Sibel Pamukcu, B. Carson
        Pages 273-280
      4. J. P. M. Syvitski, K. W. Asprey, D. E. Heffler
        Pages 281-289
      5. A. G. Altschaeffl, S. Thevanayagam
        Pages 291-295
      6. R. E. Ferrell Jr., P. K. Carpenter
        Pages 297-301
      7. George D. Brunton
        Pages 303-304
    3. Measurements/Techniques/Sampling Strategy

      1. Roy J. Baerwald, Patti J. Burkett, Richard H. Bennett
        Pages 309-320
      2. W. A. Chiou, William R. Bryant, Richard H. Bennett
        Pages 333-352
      3. Peter Smart, N. K. Tovey, X. Leng, M. W. Hounslow, I. McConnochie
        Pages 359-366
      4. W. A. Chiou, William R. Bryant, Richard H. Bennett
        Pages 379-387
      5. R. D. Stoll
        Pages 395-402
      6. Michael D. Richardson, Enrico Muzi, Luigi Troiano, Bruno Miaschi
        Pages 403-415
    4. Applications: Present Requirements

About this book

Introduction

Knowledge of basic clay microstructure is fundamental to an understanding of the physical, chemical, and mechanical properties of fine-grained sediments and rocks. This compilation of fifty-nine peer-reviewed papers examines clay microstructure in detail with comprehensive sections focusing on microstructure signatures, environmental processes, modeling, measurement techniques, and future research recommendations. Many of these topics are discussed in light of geological and engineering applications, such as hazardous waste disposal, construction techniques, and drilling programs. The field of clay microstructure is developing rapidly. The concepts, observations, and principles presented in this book will help stimulate new thought and be a "spring board" for exciting new research.

Keywords

Forearc Sediment Sedimentation Turbidite fabric fluvial silt

Editors and affiliations

  • Richard H. Bennett
    • 1
  • William R. Bryant
    • 2
  • Matthew H. Hulbert
    • 3
  • W. A. Chiou
  • R. W. Faas
  • J. Kasprowicz
  • H. Li
  • T. Lomenick
  • N. R. O’Brien
  • S. Pamukcu
  • P. Smart
  • C. E. Weaver
  • T. Yamamoto
  1. 1.Seafloor Geosciences DivisionNaval Ocean Research and Development ActivityStennis Space CenterUSA
  2. 2.Department of OceanographyTexas A&M UniversityCollege StationUSA
  3. 3.IMC/Pitman-Moore, Inc.Terre HauteUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4612-4428-8
  • Copyright Information Springer-Verlag New York 1991
  • Publisher Name Springer, New York, NY
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4612-8766-7
  • Online ISBN 978-1-4612-4428-8
  • Series Print ISSN 0939-6055
  • Buy this book on publisher's site