Overview
- Presents the latest technologies and solutions for industrial inspection
- Covers both theoretical advances and current engineering practices
- Includes case studies that illustrate applications of the techniques to real problems
- Includes supplementary material: sn.pub/extras
Part of the book series: Advances in Computer Vision and Pattern Recognition (ACVPR)
Access this book
Tax calculation will be finalised at checkout
Other ways to access
About this book
Similar content being viewed by others
Keywords
Table of contents (15 chapters)
-
Technology Advances
-
Applications and System Integration for Vision-Based Inspection
Editors and Affiliations
About the editors
Dr. Zheng Liu is an Associate Professor at the University of British Columbia, Kelowna, BC, Canada. Dr. Hiroyuki Ukida is an Associate Professor in the Institute of Technology and Science at the University of Tokushima, Japan. Dr. Pradeep Ramuhalli is a Senior Research Scientist at the Pacific Northwest National Laboratory, Richland, WA, USA. Dipl.-Ing. Kurt Niel is the Head of the Department of Metrology and Control Engineering at the University of Applied Sciences Upper Austria, Wels, Austria.
Bibliographic Information
Book Title: Integrated Imaging and Vision Techniques for Industrial Inspection
Book Subtitle: Advances and Applications
Editors: Zheng Liu, Hiroyuki Ukida, Pradeep Ramuhalli, Kurt Niel
Series Title: Advances in Computer Vision and Pattern Recognition
DOI: https://doi.org/10.1007/978-1-4471-6741-9
Publisher: Springer London
eBook Packages: Computer Science, Computer Science (R0)
Copyright Information: Springer-Verlag London (outside the USA) 2015
Hardcover ISBN: 978-1-4471-6740-2Published: 05 October 2015
Softcover ISBN: 978-1-4471-6980-2Published: 23 August 2016
eBook ISBN: 978-1-4471-6741-9Published: 24 September 2015
Series ISSN: 2191-6586
Series E-ISSN: 2191-6594
Edition Number: 1
Number of Pages: X, 541
Number of Illustrations: 394 b/w illustrations, 13 illustrations in colour
Topics: Image Processing and Computer Vision, Pattern Recognition