Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

  • Weronika Walkosz

Part of the Springer Theses book series (Springer Theses)

Table of contents

  1. Front Matter
    Pages i-xiii
  2. Weronika Walkosz
    Pages 1-10
  3. Weronika Walkosz
    Pages 11-21
  4. Weronika Walkosz
    Pages 23-43
  5. Weronika Walkosz
    Pages 91-96
  6. Weronika Walkosz
    Pages 97-100
  7. Back Matter
    Pages 101-108

About this book

Introduction

This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si3N4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF).  These interfaces are of a great fundamental and technological interest because they play an important role in the microstructural evolution and mechanical properties of Si3N4 ceramics used in many high temperature and pressure applications.  The main contribution of this work is its detailed description of the bonding characteristics of light atoms, in particular oxygen and nitrogen, at these interfaces, which has not been achieved before.  The atomic-scale information on the arrangement of both light and heavy atoms is critical for realistic modeling of interface properties, such as interface strength and ion transport, and will facilitate increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.

This Doctoral Thesis has been accepted by the University of Illinois-Chicago, Chicago, USA.

Keywords

Born Oppenheimer approximation Electron Energy Loss Spectroscopy Experimental tools Interfacial bonding Multivariate Statistical Analysis PlaneWaves Projector Augumented Wave Method Pseudopotentials Si3N4 Silicon nitride ceramics

Authors and affiliations

  • Weronika Walkosz
    • 1
  1. 1.ArgonneUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4419-7817-2
  • Copyright Information Springer Science+Business Media, LLC 2011
  • Publisher Name Springer, New York, NY
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-1-4419-7816-5
  • Online ISBN 978-1-4419-7817-2
  • About this book