Process Variations and Probabilistic Integrated Circuit Design

  • Manfred Dietrich
  • Joachim Haase

Table of contents

  1. Front Matter
    Pages i-xvi
  2. Joachim Haase, Manfred Dietrich
    Pages 1-10
  3. Bernd Lemaitre, Christoph Sohrmann, Lutz Muche, Joachim Haase
    Pages 11-67
  4. Emrah Acar, Hendrik Mau, Andy Heinig, Bing Li, Ulf Schlichtmann
    Pages 69-89
  5. Christoph Knoth, Ulf Schlichtmann, Bing Li, Min Zhang, Markus Olbrich, Emrah Acar et al.
    Pages 91-179
  6. Alyssa C. Bonnoit, Reimund Wittmann
    Pages 181-213
  7. Manfred Dietrich
    Pages 215-222
  8. Back Matter
    Pages 223-249

About this book

Introduction

Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process.  Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.
 
This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits.  Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. 

  • Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process;
  • Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design;
  • Describes critical effects of process variation using simple examples that can be reproduced by the reader.

 

 

 

Keywords

Circuit Design DFM Design for Manufacturing Embedded Systems Probabilistic integrated circuit design Process Variation

Editors and affiliations

  • Manfred Dietrich
    • 1
  • Joachim Haase
    • 2
  1. 1.Integrierte Schaltungen, Institutsteil EntwurfsautomatisierungFraunhofer -Institut furDresdenGermany
  2. 2.Integrierte Schaltungen, Institutsteil EntwurfsautomatisierungFraunhofer -Institut furDresdenGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4419-6621-6
  • Copyright Information Springer Science+Business Media, LLC 2012
  • Publisher Name Springer, New York, NY
  • eBook Packages Engineering
  • Print ISBN 978-1-4419-6620-9
  • Online ISBN 978-1-4419-6621-6
  • About this book