Skip to main content
  • Book
  • © 1999

X-Ray and Neutron Reflectivity: Principles and Applications

  • This is the first comprehensive introduction to x-ray and neutron reflectivity.

  • Includes supplementary material: sn.pub/extras

Part of the book series: Lecture Notes in Physics Monographs (LNPMGR, volume 58)

Buying options

eBook USD 84.99
Price excludes VAT (USA)
  • ISBN: 978-3-540-48696-1
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book USD 109.99
Price excludes VAT (USA)

This is a preview of subscription content, access via your institution.

Table of contents (10 chapters)

  1. Front Matter

    Pages I-XXIII
  2. Principles

    1. The Interaction of X-rays (and Neutrons) with Matter

      • François de Bergevin
      Pages 3-59
    2. Statistical Aspects of Wave Scattering at Rough Surfaces

      • Anne Sentenac, Jean Daillant
      Pages 60-86
    3. Diffuse Scattering

      • Jean Daillant, Anne Sentenac
      Pages 121-162
    4. Neutron Reflectometry

      • Claude Fermon, Frédéric Ott, Alain Menelle
      Pages 163-195
  3. Applications

    1. Statistical Physics at Crystal Surfaces

      • Alberto Pimpinelli
      Pages 199-216
    2. Experiments on Solid Surfaces

      • Jean-Marc Gay, Laurent Lapena
      Pages 217-231
    3. X-ray Reflectivity by Rough Multilayers

      • Tilo Baumbach, Petr Mikulik
      Pages 232-280
    4. polymer Studies

      • Günter Reiter
      Pages 305-323
  4. Back Matter

    Pages 325-331

About this book

The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.

Keywords

  • condensed matter
  • crystal
  • polymer
  • scattering
  • surface

Authors and Affiliations

  • Service de Physique de I’Etat Condensé, CEA Saclay, Gif-sur-Yvette Cedex, France

    Jean Daillant

  • Laboratoire de Physique de l’Etat Condensé, UPRES A 6087, Université du Maine, Faculté des sciences, Le Mans Cedex 9, France

    Alain Gibaud

Bibliographic Information

Buying options

eBook USD 84.99
Price excludes VAT (USA)
  • ISBN: 978-3-540-48696-1
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book USD 109.99
Price excludes VAT (USA)