Hot-Electron Transport in Semiconductors

  • Editors
  • Lino┬áReggiani

Part of the Topics in Applied Physics book series (TAP, volume 58)

Table of contents

  1. Front Matter
    Pages I-XVI
  2. Lino Reggiani
    Pages 1-6
  3. Lino Reggiani
    Pages 7-86
  4. Claudio Canali, Filippo Nava, Lino Reggiani
    Pages 87-112
  5. Susumu Komiyama, Tatsumi Kurosawa, Taizo Masumi
    Pages 177-199
  6. Karl Hess, Gerald J. Iafrate
    Pages 201-226
  7. Back Matter
    Pages 263-275

About this book

Keywords

Transport diffusion distribution electrons measurement microwave noise semiconductor semiconductors structures superlattice superlattices time-of-flight

Bibliographic information

  • DOI https://doi.org/10.1007/3-540-13321-6
  • Copyright Information Springer-Verlag Berlin Heidelberg 1985
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-540-13321-6
  • Online ISBN 978-3-540-38849-4
  • Series Print ISSN 0303-4216
  • Series Online ISSN 1437-0859
  • About this book