Structural, Syntactic, and Statistical Pattern Recognition

Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings

  • Dit-Yan Yeung
  • James T. Kwok
  • Ana Fred
  • Fabio Roli
  • Dick de Ridder

Part of the Lecture Notes in Computer Science book series (LNCS, volume 4109)

Table of contents

  1. Front Matter
  2. Invited Talks

  3. SSPR

    1. Image Analysis

    2. Vision

      1. Roberto Fraile, Edwin Hancock
        Pages 92-99
      2. A. Negre, H. Tran, N. Gourier, D. Hall, A. Lux, J. L. Crowley
        Pages 100-108
      3. Pakaket Wattuya, Xiaoyi Jiang
        Pages 109-117
    3. Character Recognition

      1. Yan Jiang, Xiaoqing Ding, Qiang Fu, Zheng Ren
        Pages 127-135
      2. Christopher Malon, Seiichi Uchida, Masakazu Suzuki
        Pages 136-144
    4. Bayesian Networks

      1. Yaniv Gurwicz, Boaz Lerner
        Pages 145-153
    5. Graph-Based Methods

      1. Michel Neuhaus, Kaspar Riesen, Horst Bunke
        Pages 163-172
      2. Bai Xiao, Edwin R Hancock
        Pages 173-181
      3. Adrian Ion, Walter G. Kropatsch, Yll Haxhimusa
        Pages 182-190

About these proceedings

Keywords

Bayesian network Monte Carlo Method bayesian networks biometrics clustering document analysis feature extraction graphical pattern recognition image analysis modeling object recognition pattern recognition robot statistic statistics

Editors and affiliations

  • Dit-Yan Yeung
    • 1
  • James T. Kwok
    • 2
  • Ana Fred
    • 3
  • Fabio Roli
    • 4
  • Dick de Ridder
    • 5
  1. 1.Hong Kong University of Science and Technology 
  2. 2.Department of Computer ScienceHong Kong University of Science and TechnologyKowloon, Hong KongChina
  3. 3.Instituto de TelecomunicaçõesInstituto Superior TécnicoLisbonPortugal
  4. 4.Department of Electrical and Electronic EngineeringUniversity of CagliariCagliariItaly
  5. 5.Faculty of Electrical Engineering, Mathematics and Computer Science, Information and Communication Theory GroupDelft University of TechnologyDelftThe Netherlands

Bibliographic information

  • DOI https://doi.org/10.1007/11815921
  • Copyright Information Springer-Verlag Berlin Heidelberg 2006
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Computer Science
  • Print ISBN 978-3-540-37236-3
  • Online ISBN 978-3-540-37241-7
  • Series Print ISSN 0302-9743
  • Series Online ISSN 1611-3349
  • About this book