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Handbook of Microscopy for Nanotechnology

  • Nan Yao
  • Zhong Lin Wang

Table of contents

  1. Front Matter
    Pages i-xx
  2. Optical Microscopy, Scanning Probe Microscopy, Ion Microscopy and Nanofabrication

    1. Front Matter
      Pages 1-1
    2. Alexandre Bouhelier, Achim Hartschuh, Lukas Novotny
      Pages 25-54
    3. Jin-Feng Jia, Wei-Sheng Yang, Qi-Kun Xue
      Pages 55-112
    4. Sergei N. Magonov, Natalya A. Yerina
      Pages 113-155
    5. Seunghun Hong, Jiwoon Im, Minbaek Lee, Narae Cho
      Pages 157-182
    6. William A. Lamberti
      Pages 207-225
    7. M. K. Miller
      Pages 227-246
    8. Zhiping James Zhou
      Pages 287-321
  3. Electron Microscopy

    1. Front Matter
      Pages 323-323
    2. Dale E. Newbury, John Henry J. Scott, Scott Wight, John A. Small
      Pages 361-400
    3. J. M. Cowley
      Pages 455-491
    4. Renu Sharma, Peter A. Crozier
      Pages 531-565
    5. Jian-Min Zuo
      Pages 567-599
    6. Martha R. McCartney, Rafal E. Dunin-Borkowski, David J. Smith
      Pages 629-651
    7. Christian Colliex, Odile StÈphan
      Pages 653-681
    8. Takayoshi Tanji
      Pages 683-715
  4. Back Matter
    Pages 717-731

About this book

Introduction

Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

Keywords

crystallography electron microscope microscopy nanostructure nanotechnology scanning electron microscope scanning transmission electron microscope spectroscopy transmission electron microscopy

Editors and affiliations

  • Nan Yao
    • 1
  • Zhong Lin Wang
    • 2
  1. 1.Princeton UniversityPrincetonUSA
  2. 2.Georgia Institute of TechnologyAtlantaUSA

Bibliographic information