Poverty, Inequality and Development

Essays in Honor of Erik Thorbecke

  • Alain de Janvry
  • Ravi Kanbur

Part of the Economic Studies in Inequality, Social Exclusion and Well-Being book series (EIAP, volume 1)

Table of contents

  1. Front Matter
    Pages i-xiii
  2. Jacob Kol
    Pages 9-14
  3. Martin Ravallion, Michael Lokshin
    Pages 15-39
  4. James E. Foster
    Pages 41-65
  5. David E. Sahn
    Pages 75-108
  6. Christopher B. Barrett, John G. McPeak
    Pages 131-154
  7. Alain de Janvry, Elisabeth Sadoulet
    Pages 155-181
  8. Graham Pyatt, Jeffery I. Round
    Pages 233-259
  9. Tjeerd Jellema, Steven Keuning, Peter McAdam, Reimund Mink
    Pages 261-286
  10. Gustav Ranis
    Pages 371-385

About this book

Introduction

Traditionally, there have been two strands in the analysis of poverty, inequality and development – a micro strand that focuses on individual behavior, welfare economics and the measurement of inequality and poverty; and a macro strand that analyzes economy-wide policies and the role of institutions. This unique volume brings together both strands in a series of essays written by leading experts in the field of economic development. Topics include measurement issues, micro-behavior determinants of poverty outcomes, economy-wide models in the SAM-CGE tradition and the institutional framework underlying macro policies.

Alain de Janvry teaches agricultural and resource economics at the University of California, Berkeley.

Ravi Kanbur teaches applied economics at Cornell University.

Keywords

Economic Development Income inequality development inequality poverty

Editors and affiliations

  • Alain de Janvry
    • 1
  • Ravi Kanbur
    • 2
  1. 1.University of CaliforniaBerkeley
  2. 2.Cornell UniversityUSA

Bibliographic information

  • DOI https://doi.org/10.1007/0-387-29748-0
  • Copyright Information Springer Science+Business Media, Inc. 2006
  • Publisher Name Springer, Boston, MA
  • eBook Packages Business and Economics
  • Print ISBN 978-1-4020-7850-7
  • Online ISBN 978-0-387-29748-4
  • About this book