Ferroelectric Thin Films

Basic Properties and Device Physics for Memory Applications

  • Editors
  • Masanori Professor Okuyama
  • Yoshihiro Ishibashi

Part of the Topics in Applied Physics book series (TAP, volume 98)

Table of contents

  1. Front Matter
  2. Shin-ichi Hirano, Takashi Hayashi, Wataru Sakamoto, Koichi Kikuta, Toshinobu Yogo
    Pages 25-59
  3. Masaru Shimizu, Hironori Fujisawa, Hirohiko Niu
    Pages 59-77
  4. Back Matter

About this book


Ferroelectric thin films continue to attract much attention due to their developing, diverse applications in memory devices, FeRAM, infrared sensors, piezoelectric sensors and actuators. This book, aimed at students, researchers and developers, gives detailed information about the basic properties of these materials and the associated device physics. All authors are acknowledged experts in the field.


Ferroelectrics Helium-Atom-Streuung Material properties Memory devices Polarization hysteresis Semiconductor Sensor crystal dielectric properties metal physics thin film

Bibliographic information