Applied Scanning Probe Methods III

Characterization

  • Bharat Bhushan
  • Harald Fuchs
Part of the NanoScience and Technology book series (NANO)

Table of contents

  1. Front Matter
    Pages I-XLIII
  2. Dessy Nikova, Tobias Lange, Hans Oberleithner, Hermann Schillers, Andreas Ebner, Peter Hinterdorfer
    Pages 1-26
  3. Ille C. Gebeshuber, Manfred Drack, Friedrich Aumayr, Hannspeter Winter, Friedrich Franek
    Pages 27-53
  4. Oleg Tikhomirov, Massimiliano Labardi, Maria Allegrini
    Pages 217-259
  5. Nikolai K. Myshkin, Mark I. Petrokovets, Alexander V. Kovalev
    Pages 299-326
  6. Lev Rapoport, Armen Verdyan
    Pages 327-342
  7. Back Matter
    Pages 371-378

About this book

Introduction

The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

Keywords

AFM Fulleren Fullerene STEM ceramics microscopy nanoparticle polymer spectroscopy

Editors and affiliations

  • Bharat Bhushan
    • 1
  • Harald Fuchs
    • 2
  1. 1.Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM)The Ohio State UniversityColumbusUSA
  2. 2.Center for Nanotechnology (CeNTech) and Institute of PhysicsUniversity of MünsterMünsterGermany

Bibliographic information

  • DOI https://doi.org/10.1007/b138285
  • Copyright Information Springer-Verlag Berlin Heidelberg 2006
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-3-540-26909-0
  • Online ISBN 978-3-540-26910-6
  • Series Print ISSN 1434-4904
  • About this book