Dynamic Characterisation of Analogue-to-Digital Converters

  • Dominique Dallet
  • José Machado da Silva
Part of the The International Series in Engineering and Computer Science book series (SECS, volume 860)

Table of contents

  1. Front Matter
    Pages i-xx
  2. ADC Characterisation Based on Sinewave Analysis

    1. Front Matter
      Pages 1-1
    2. José Machado da Silva, Hélio Mendonça
      Pages 3-45
    3. Pierre-Yves Roy, Jacques Durand
      Pages 47-60
    4. Dominique Dallet, Djamel Haddadi, Philippe Marchegay
      Pages 61-84
    5. Pierre-Yves Roy, Jacques Durand
      Pages 85-103
    6. Giovanni Chiorboli, Carlo Morandi
      Pages 105-156
    7. José Machado da Silva, Hélio Mendonça, Sara Mazoleni
      Pages 157-215
  3. Measurement of Additional Parameters

    1. Front Matter
      Pages 217-217
    2. Pierre-Yves Roy, Jacques Durand
      Pages 219-233
    3. José Machado da Silva, Hélio Mendonça
      Pages 235-242
    4. Giovanni Chiorboli, Carlo Morandi
      Pages 243-254
    5. Giovanni Chiorboli, Carlo Morandi
      Pages 255-264
  4. Back Matter
    Pages 265-280

About this book

Introduction

The Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for system’s performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architecture and characteristics for each end application, and on the other hand, to understand how they affect performance bottlenecks in the signal processing chain.

Dynamic Characterisation of Analogue-to-Digital Converters presents a state of the art overview of the methods and procedures employed for characterising ADCs’ dynamic performance behaviour using sinusoidal stimuli. The three classical methods – histogram, sine wave fitting, and spectral analysis – are thoroughly described, and new approaches are proposed to circumvent some of their limitations.

This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the most important and critical details for their implementation.

Keywords

Analog-Digital-Umsetzer Analog-to-Digital Converters Fitting Phase SECS Signal Sine Wave Test Methods analog communication measurement signal processing testing

Authors and affiliations

  • Dominique Dallet
    • 1
  • José Machado da Silva
    • 2
  1. 1.Laboratoire IXL-ENSEIRBBordeauxFrance
  2. 2.Universidade do PortoINESC-PortoPortugal

Bibliographic information

  • DOI https://doi.org/10.1007/b136458
  • Copyright Information Springer 2005
  • Publisher Name Springer, Boston, MA
  • eBook Packages Engineering
  • Print ISBN 978-0-387-25902-4
  • Online ISBN 978-0-387-25903-1
  • Series Print ISSN 0893-3405