About this book
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
- Book Title High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test
- Series Title Frontiers in Electronic Testing
- DOI https://doi.org/10.1007/b101876
- Copyright Information Kluwer Academic Publishers 2003
- Publisher Name Springer, Boston, MA
- eBook Packages Springer Book Archive
- Hardcover ISBN 978-1-4020-7255-0
- Softcover ISBN 978-1-4757-8474-9
- eBook ISBN 978-0-306-47972-4
- Series ISSN 0929-1296
- Edition Number 1
- Number of Pages XIV, 250
- Number of Illustrations 0 b/w illustrations, 0 illustrations in colour
Circuits and Systems
Computer-Aided Engineering (CAD, CAE) and Design
- Buy this book on publisher's site
From the reviews:
"Fulfilling a need in the industry and a need in the literature, the book is certain to stimulate a heightened research interest in memory test, memory design, and memory elf test, each of which by itself constitutes an intriguing subject. The observations and approaches of the book make it a most useful work for the professional and the researcher in helping them understand the memories that are being tested." (Current Engineering Practice, Vol. 47, 2002-2003)