Boundary-Scan Interconnect Diagnosis

  • José T. de Sousa
  • Peter Y. K. Cheung

Part of the Frontiers in Electronic Testing book series (FRET, volume 18)

Table of contents

  1. Front Matter
    Pages i-xxi
  2. Pages 1-20
  3. Pages 111-127
  4. Pages 129-135
  5. Back Matter
    Pages 137-168

About this book


Boundary-Scan Interconnect Diagnosis explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to assess the quality of those sequences. Its importance has to do with designing complex electronic systems using pre-designed intellectual property (IP) cores, which is becoming increasingly popular nowadays. Since tests for pre-designed cores can be supplied with the cores themselves, the only additional tests that need to be developed to test and diagnose the entire system are those for wire interconnects between the cores.
Besides the trivial solutions that are often used to solve this problem, there are many more methods that enable significant optimizations of test vector length and/or diagnostic resolution. The book surveys all existing methods of this kind and proposes new ones. In the new approach circuit and interconnect faults are carefully modeled, and graph techniques are applied to solve the problem. The original feature of the new method is the fact that it can be adjusted to provide shorter test sequences and/or greater diagnostic resolution. The effectiveness of existing and proposed methods is then evaluated using real electronic assemblies and published statistical data for an actual manufacturing process from HP.


circuit diagnosis interconnect manufacturing modeling

Authors and affiliations

  • José T. de Sousa
    • 1
  • Peter Y. K. Cheung
    • 2
  1. 1.Technical University of LisbonPortugal
  2. 2.Imperial College of Science Technology and MedicineUniversity of LondonUK

Bibliographic information

  • DOI
  • Copyright Information Kluwer Academic Publishers 2001
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-0-7923-7314-8
  • Online ISBN 978-0-306-47975-5
  • Series Print ISSN 0929-1296
  • Buy this book on publisher's site