Surface Scattering Experiments with Conduction Electrons

  • Dieter Schumacher

Part of the Springer Tracts in Modern Physics book series (STMP, volume 128)

Table of contents

  1. Front Matter
    Pages i-ix
  2. Dieter Schumacher
    Pages 1-1
  3. Dieter Schumacher
    Pages 17-29
  4. Dieter Schumacher
    Pages 31-52
  5. Dieter Schumacher
    Pages 53-81
  6. Dieter Schumacher
    Pages 83-83
  7. Back Matter
    Pages 85-97

About this book


Surface Scattering Experiments with Conduction Electrons shows how this process can be used to investigate surface processes of thin metal films. Since a thin film is in one direction of a size comparable to the mean free path of the conduction electrons, such a film is both substrate and sensor and must be characterized by other surface-analytical methodsas demonstrated here. Also discussed is how the dc-resistivity measurement permits the study of surface processes such as adsorption, desorption, and surface diffusion up to crystalline growth. The in situ observation of epitaxial growth is additionally shown to be possible. Thus the electronic structure of superimposed metal films and superlattices can be elucidated. This is an essential topic for all surface physicists.


Dünne Schichten Elektronenstreuung Leitfähigkeit Oberflächenphysik electronic structure electronic structure and electrical properties of surfaces film interfaces and thin films scattering superlattices surface surface physics thin films

Authors and affiliations

  • Dieter Schumacher
    • 1
  1. 1.Lehrstuhl für OberflächenwissenschaftHeinrich-Heine-Universität DüsseldorfDüsseldorf 1Germany

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 1993
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-540-56106-4
  • Online ISBN 978-3-540-47474-6
  • Series Print ISSN 0081-3869
  • Series Online ISSN 1615-0430
  • Buy this book on publisher's site