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Inside Solid State Drives (SSDs)

  • Rino Micheloni
  • Alessia Marelli
  • Kam Eshghi
Book

Part of the Springer Series in Advanced Microelectronics book series (MICROELECTR., volume 37)

Table of contents

  1. Front Matter
    Pages i-xxi
  2. Kam Eshghi, Rino Micheloni
    Pages 1-27
  3. S. Yasarapu
    Pages 29-41
  4. Rino Micheloni, Luca Crippa, M. Picca
    Pages 43-59
  5. M. F. Beug
    Pages 61-104
  6. Rino Micheloni, Seiichi Aritome, Luca Crippa
    Pages 105-133
  7. Luca Crippa, Rino Micheloni
    Pages 135-180
  8. L. Zuolo, C. Zambelli, Rino Micheloni, P. Olivo
    Pages 181-204
  9. C. Zambelli, P. Olivo
    Pages 205-232
  10. Yu Cai, Saugata Ghose, Erich F. Haratsch, Yixin Luo, Onur Mutlu
    Pages 233-341
  11. Yuan-Hao Chang, Li-Pin Chang
    Pages 343-367
  12. Alessia Marelli, Rino Micheloni
    Pages 369-406
  13. E. Paolini
    Pages 407-453
  14. Alessia Marelli, Rino Micheloni
    Pages 455-477
  15. Back Matter
    Pages 479-485

About this book

Introduction

The revised second edition of this respected text provides a state-of-the-art overview of the main topics relating to solid state drives (SSDs), covering NAND flash memories, memory controllers (including booth hardware and software), I/O interfaces (PCIe/SAS/SATA), reliability, error correction codes (BCH and LDPC), encryption, flash signal processing and hybrid storage.

Updated throughout to include all recent work in the field, significant changes for the new edition include:

  • A new chapter on flash memory errors and data recovery procedures in SSDs for reliability and lifetime improvement
  • Updated coverage of SSD Architecture and PCI Express Interfaces moving from PCIe Gen3 to PCIe Gen4 and including a section on NVMe over fabric (NVMf)
  • An additional section on 3D flash memories
  • An update on standard reliability procedures for SSDs
  • Expanded coverage of BCH for SSDs, with a specific section on detection
  • A new section on non-binary Low-Density Parity-Check (LDPC) codes, the most recent advancement in the field
  • A description of randomization in the protection of SSD data against attacks, particularly relevant to 3D architectures

The SSD market is booming, with many industries placing a huge effort in this space, spending billions of dollars in R&D and product development. Moreover, flash manufacturers are now moving to 3D architectures, thus enabling an even higher level of storage capacity. This book takes the reader through the fundamentals and brings them up to speed with the most recent developments in the field, and is suitable for advanced students, researchers and engineers alike.    

Keywords

Flash memory controllers Flash Signal Processing Hybrid data storage NAND Flash Memories Solid State Drive (SSD) architecture Solid State Drive (SSD) data storage BCH and error-correcting codes for SSD SSD reliability and data recovery Low-Density Parity-Check (LDPC) Codes

Editors and affiliations

  • Rino Micheloni
    • 1
  • Alessia Marelli
    • 2
  • Kam Eshghi
    • 3
  1. 1.Microsemi CorporationVimercateItaly
  2. 2.Microsemi CorporationVimercateItaly
  3. 3.Lightbits LabsSan JoseUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-981-13-0599-3
  • Copyright Information Springer Nature Singapore Pte Ltd. 2018
  • Publisher Name Springer, Singapore
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-981-13-0598-6
  • Online ISBN 978-981-13-0599-3
  • Series Print ISSN 1437-0387
  • Series Online ISSN 2197-6643
  • Buy this book on publisher's site