Advertisement

Field Emission Scanning Electron Microscopy

New Perspectives for Materials Characterization

  • Nicolas Brodusch
  • Hendrix Demers
  • Raynald Gauvin

Part of the SpringerBriefs in Applied Sciences and Technology book series (BRIEFSAPPLSCIENCES)

Table of contents

  1. Front Matter
    Pages i-xii
  2. Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
    Pages 1-4
  3. Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
    Pages 5-12
  4. Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
    Pages 13-35
  5. Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
    Pages 37-46
  6. Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
    Pages 47-53
  7. Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
    Pages 55-65
  8. Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
    Pages 67-84
  9. Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
    Pages 85-105
  10. Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
    Pages 107-113
  11. Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
    Pages 115-128
  12. Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
    Pages 129-131
  13. Back Matter
    Pages 133-137

About this book

Introduction

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Keywords

Field emission gun technologies Ionic liquid treatment Dual in-lens electron detection Low voltage SEM X-ray imaging Silicon drift detector Electron Channeling Contrast Imaging Electron Backscatter Diffraction Magnetic domain imaging Dark-Field Imaging

Authors and affiliations

  • Nicolas Brodusch
    • 1
  • Hendrix Demers
    • 2
  • Raynald Gauvin
    • 3
  1. 1.Department of Mining and Materials EngineeringMcGill UniversityMontrealCanada
  2. 2.Department of Mining and Materials EngineeringMcGill UniversityMontrealCanada
  3. 3.Department of Mining and Materials EngineeringMcGill UniversityMontrealCanada

Bibliographic information

  • DOI https://doi.org/10.1007/978-981-10-4433-5
  • Copyright Information The Author(s) 2018
  • Publisher Name Springer, Singapore
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-981-10-4432-8
  • Online ISBN 978-981-10-4433-5
  • Series Print ISSN 2191-530X
  • Series Online ISSN 2191-5318
  • Buy this book on publisher's site