Table of contents

  1. Front Matter
    Pages I-X
  2. Overview of Applications and Needs

    1. Front Matter
      Pages N1-N1
    2. M. F. Rose, A. K. Hyder, M. Kristiansen
      Pages 1-4
  3. Voltage and Current Measurements

  4. Data Acquisition

  5. Grounding and Shielding

  6. Fast Photography

  7. Refractive Index Measurements

  8. X-Ray Diagnostics

    1. Front Matter
      Pages N13-N13
    2. F. Jamet
      Pages 845-861
    3. J. Chang
      Pages 863-884
  9. Spectroscopy

    1. Front Matter
      Pages N15-N15
    2. H. R. Griem
      Pages 885-910
    3. G. Tondello
      Pages 911-950
  10. Active Optical Techniques

    1. Front Matter
      Pages N17-N17
    2. S. J. Davis
      Pages 951-969
    3. William K. Bischel
      Pages 971-999
    4. James J. Valentini
      Pages 1001-1021
    5. Gary R. Allen, H. Parke Davis, J. Chang
      Pages 1023-1035
  11. Back Matter
    Pages 1037-1067

About this book


An Advanced Study Institute on Fast Electrical and Optical Diagnostic Principles and Techniques was held at II Ciocco, Castelvecchio Pascoli, Italy, 10-24 July 1983. This publication is the Proceedings from that Institute. The Institute was attended by ninety-seven participants representing the United States, West Germany, the United Kingdom, Switzerland, Norway, the Netherlands, Italy, and France. The objective of the Institute was to provide a broad but comprehensive presentation of the various measurement and analy­ sis techniques that can be employed to investigate fast physical events, nominally in the sub-microsecond regime. This requires both an understanding of the basic principles underlying the diagnostic employed and its limitations, and a knowledge of the practical techniques available to obtain reliable and repeatable data. This Institute was thus structured to begin tutorially, followed by more practical techniques, demonstrations, and discussions. The Institute was divided into the following major sections: (1) Overview of Applications and Needs; (2) Voltage and Current Measurements; (3) Data Acquisition; (4) Grounding and Shield­ ing; (5) Fast Photography; (6) Refractive Index Measurements; (7) X-ray Diagnostics; (8) Spectroscopy; and (9) Active Opti­ cal Techniques. This Proceeding has been divided into two separate volumes. Volume 1, Current and Voltage Measurements, includes Sections (1) through (4) above; Volume 2, Optical Meas­ urements, includes Sections (5) through (9).


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Editors and affiliations

  • James E. Thompson
    • 1
  • Lawrence H. Luessen
    • 2
  1. 1.Electrical Engineering DepartmentUniversity of Texas at ArlingtonArlingtonUSA
  2. 2.Naval Surface Weapons CenterDahlgrenUSA

Bibliographic information

  • DOI
  • Copyright Information Springer Science+Business Media B.V. 1986
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-94-017-0447-2
  • Online ISBN 978-94-017-0445-8
  • Series Print ISSN 0168-132X
  • Buy this book on publisher's site