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Nanoscale Probes of the Solid/Liquid Interface

  • Andrew A. Gewirth
  • Hans Siegenthaler

Part of the NATO ASI Series book series (NSSE, volume 288)

Table of contents

  1. Front Matter
    Pages i-xv
  2. S. M. Lindsay, T. W. Jing, J. Pan, D. Lampner, A. Vaught, J. P. Lewis et al.
    Pages 25-43
  3. Guy Denuault, Maria Helena Troise Frank, Steven Nugues
    Pages 69-82
  4. John R. LaGraff, Andrew A. Gewirth
    Pages 83-101
  5. B. M. Ocko, O. M. Magnussen, J. X. Wang, R. R. Adžić
    Pages 103-119
  6. N. Breuer, U. Stimming, R. Vogel
    Pages 121-136
  7. T. Will, M. Dietterle, D. M. Kolb
    Pages 137-162
  8. Wenjie Li, Tim Duong, Jorma A. Virtanen, Reginald M. Penner
    Pages 183-192
  9. D. M. Kolb, A. S. Dakkouri, N. Batina
    Pages 263-284
  10. E. Weilandt, A. Menck, M. Binggeli, O. Marti
    Pages 307-315
  11. P. A. R. Descouts
    Pages 317-331
  12. Back Matter
    Pages 333-334

About this book

Introduction

Nanoscale Probes of the Solid--Liquid Interface deals with the use of the scanning tunnelling microscope (STM) and related instrumentation to examine the phenomena occurring at the interface between solid and liquid.
Scanning probe microscopy (the collective term for such instruments as the STM, the atomic force microscope and related instrumentation) allows detailed, real space atomic or lattice scale insight into surface structures, information which is ideally correlated with surface reactivity. The use of SPM methods is not restricted to ultrahigh vacuum: the STM and AFM have been used on samples immersed in solution or in ambient air, thus permitting a study of environmental effects on surfaces. At the solid--liquid interface the reactivity derives precisely from the presence of the solution and, in many cases, the application of an external potential.
Topics covered in the present volume include: the advantages of studying the solid--liquid interface and the obtaining of additional information from probe measurements; interrelationships between probe tip, the interface and the tunnelling process; STM measurements on semiconductor surfaces; the scanning electrochemical microscope, AFM and the solid--liquid interface; surface X-ray scattering; cluster formation on graphite electrodes; Cu deposition on Au surfaces; macroscopic events following Cu deposition; deposition of small metallic clusters on carbon; overpotential deposition of metals; underpotential deposition; STM on nanoscale ceramic superlattices; reconstruction events on Au(ijk) surfaces; Au surface reconstructions; friction force measurements on graphite steps under potential control; and the biocompatibility of materials.

Keywords

AFM STM control electrochemistry measurement metal

Editors and affiliations

  • Andrew A. Gewirth
    • 1
  • Hans Siegenthaler
    • 2
  1. 1.Department of ChemistryUniversity of IllinoisUrbanaUSA
  2. 2.Institut für anorganische ChemieUniversität BernBernSwitzerland

Bibliographic information

  • DOI https://doi.org/10.1007/978-94-015-8435-7
  • Copyright Information Springer Science+Business Media B.V. 1995
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-90-481-4541-6
  • Online ISBN 978-94-015-8435-7
  • Series Print ISSN 0168-132X
  • Buy this book on publisher's site