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Scanning Tunneling Microscopy and Related Methods

  • R. J. Behm
  • N. Garcia
  • H. Rohrer

Part of the NATO ASI Series book series (NSSE, volume 184)

Table of contents

  1. Front Matter
    Pages i-x
  2. Methods

  3. Theory

    1. C. R. Leavens, G. C. Aers
      Pages 27-57
    2. C. R. Leavens, G. C. Aers
      Pages 59-76
    3. G. Doyen, E. Koetter, J. Barth, D. Drakova
      Pages 97-111
    4. S. Ciraci
      Pages 113-141
    5. L. Escapa, N. García
      Pages 143-156
    6. Richard G. Forbes
      Pages 163-172
  4. Applications of STM at Solid State Surfaces

  5. Liquid-Solid Interface

    1. P. K. Hansma, R. Sonnenfeld, J. Schneir, O. Marti, S. A. C. Gould, C. B. Prater et al.
      Pages 299-313
    2. H. Siegenthaler, R. Christoph
      Pages 315-333
  6. Applications of STM at Organic and Biological Materials

    1. G. Travaglini, M. Amrein, B. Michel, H. Gross
      Pages 335-347
    2. A. Cricenti, S. Selci, A. C. Felici, R. Generosi, E. Gori, W. Djaczenko et al.
      Pages 359-365
    3. C. Joachim, P. Sautet
      Pages 377-389
    4. Ricardo Garcia, N. Garcia
      Pages 391-398
  7. Electron and Ion Point Sources

    1. J. J. Saenz, N. Garcia, Thien Binh Vu, H. De Raedt
      Pages 409-441
  8. Force Microscopy

    1. H. Heinzelmann, E. Meyer, H. Rudin, H.-J. Güntherodt
      Pages 443-467
    2. E. Schreck, J. Knittel, K. Dransfeld
      Pages 469-474
  9. Optical and Acoustic Microscopy

    1. Daniel Courjon
      Pages 497-505
    2. P. Guethner, E. Schreck, K. Dransfeld, U. Ch. Fischer
      Pages 507-514
  10. Back Matter
    Pages 515-525

About this book

Keywords

AFM Adsorption Epitaxy STM Vakuuminjektionsverfahren imaging microscopy spectroscopy

Editors and affiliations

  • R. J. Behm
    • 1
  • N. Garcia
    • 2
  • H. Rohrer
    • 3
  1. 1.Institut für Kristallographie und MineralogieUniversität MünchenMünchenGermany
  2. 2.Department of PhysicsUniversidad Autonoma de MadridMadridSpain
  3. 3.IBM Research DivisionZurich Research LaboratoryRuschlikonSwitzerland

Bibliographic information

  • DOI https://doi.org/10.1007/978-94-015-7871-4
  • Copyright Information Springer Science+Business Media B.V. 1990
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-90-481-4075-6
  • Online ISBN 978-94-015-7871-4
  • Series Print ISSN 0168-132X
  • Buy this book on publisher's site