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Advances in the Crystallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals

  • Frank W. Boswell
  • J. Craig Bennett

Part of the Physics and Chemistry of Materials with Low-Dimensional Structures book series (PCMALS, volume 22)

About this book

Introduction

Modulated crystals have been intensively investigated over the past several years and it is now evident that an understanding of their crystallography and microstructure is fundamental to the elucidation of the physical properties and phase transitions in these materials. This book brings together for the first time the crystallographic descriptions and experimental methods for the structural and microstructural analysis of modulated crystals as described by well-known researchers in the various areas. The emphasis is on charge density wave modulations, and the detailed analysis of the prototypical NbTe4/TaTe4 system gives practical applications of the methods. Scanning Tunnelling Microscopy is a new technique providing significant new insights into atomic scale details of the modulations' structures and a chapter on this method is included.

Keywords

X-ray crystal crystallography electron electron microscopy metals microscopy phase transition scanning tunneling microscopy transmission electron microscopy

Editors and affiliations

  • Frank W. Boswell
    • 1
  • J. Craig Bennett
    • 2
  1. 1.Department of Physics, Faculty of SciencesUniversity of WaterlooOntarioCanada
  2. 2.Department of Physics, Faculty of Pure and Applied SciencesAcadia UniversityWolfvilleCanada

Bibliographic information

  • DOI https://doi.org/10.1007/978-94-011-4603-6
  • Copyright Information Kluwer Academic Publishers 1999
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-94-010-5945-9
  • Online ISBN 978-94-011-4603-6
  • Series Print ISSN 0924-6339
  • Buy this book on publisher's site