Scanning Tunneling Microscopy

  • H. Neddermeyer

Part of the Perspectives in Condensed Matter Physics book series (PCMP, volume 6)

Table of contents

  1. Front Matter
    Pages i-xi
  2. G. Binning, H. Rohrer, Ch. Gerber, E. Weibel
    Pages 31-35
  3. G. Binnig, H. Rohrer, Ch Gerber, E. Weibel
    Pages 36-39
  4. G. Binning, H. Rohrer
    Pages 40-54
  5. G. Binnig, C. F. Quate, Ch Gerber
    Pages 55-58
  6. J. Tersoff, D. R. Hamann
    Pages 59-67
  7. Ch Gerber, G. Binnig, H. Fechs, O. Marti, H. Rohrer
    Pages 79-82
  8. J. E. Demuth, R. J. Hamers, R. M. Tromp, M. E. Welland
    Pages 83-86
  9. G. Binnig, K. H. Frank, H. Fuchs, N. Garcia, B. Reihl, H. Rohrer et al.
    Pages 93-96
  10. R. J. Hamers, R. M. Tromp, J. E. Demuth
    Pages 97-100
  11. Joseph A. Stroscio, R. M. Feenstra, D. M. Newns, A. P. Fein
    Pages 101-109
  12. J. Wintterlin, J. Wiechers, H. Brune, T. Gritsch, H. Höfer, R. J. Behm
    Pages 110-113
  13. R. J. Hamers, R. M. Tromp, J. E. Demuth
    Pages 118-132
  14. St. Tosch, H. Neddermeyer
    Pages 141-144
  15. A. Selloni, P. Carnevali, E. Tosatti, C. D. Chen
    Pages 168-171
  16. P. H. Lippel, R. J. Wilson, M. D. Miller, Ch Wöll, S. Chiang
    Pages 184-187
  17. M. Amrein, A. Staslak, H. Gross, E. Stoll, G. Travaglini
    Pages 192-194
  18. Reinhard Guckenberger, Winfried Wiegräbe, Wolfgang Baumeister
    Pages 195-202
  19. B. Drake, R. Sonnenfeld, J. Schneir, P. K. Hansma
    Pages 203-208
  20. G. Binnig, Ch Gerber, E. Stoll, T. R. Albrecht, C. F. Quate
    Pages 213-218
  21. David W. Abraham, C. C. Williams, H. K. Wickramasinghe
    Pages 219-225
  22. C. Mathew Mate, Gary M. McClelland, Ragnar Erlandsson, Shirley Chiang
    Pages 226-229
  23. B. Giambattista, A. Johnson, R. V. Coleman, B. Drake, P. K. Hansma
    Pages 234-237
  24. H. F. Hess, R. B. Robinson, R. C. Dynes, J. M. Valles Jr., J. V. Waszczak
    Pages 238-240
  25. P. J. M. van Bentum, L. E. C. van de Leemput, R. T. M. Smokers, H. van Kempen
    Pages 241-251
  26. P. Muralt, D. W. Pohl
    Pages 252-254
  27. R. S. Becker, J. A. Golovchenko, B. S. Swartzentruber
    Pages 255-257
  28. U. Staufer, R. Wiesendanger, L. Eng, L. Rosenthaler, H.-R. Hidber, H.-J. Güntherodt et al.
    Pages 258-260
  29. Back Matter
    Pages 261-267

About this book


The publication entitled "Surface Studies by Scanning Tunneling Mi­ Rl croscopy" by Binnig, Rohrer, Gerber and Weibel of the IBM Research Lab­ oratory in Riischlikon in 1982 immediately raised considerable interest in the sur­ face science community. It was demonstrated in Reference R1 that images from atomic structures of surfaces like individual steps could be obtained simply by scanning the surface with a sharp metal tip, which was kept in a constant distance of approximately 10 A from the sample surface. The distance control in scanning tunneling microscopy (STM) was realized by a feedback circuit, where the electri­ cal tunneling current through the potential barrier between tip and sample is used for regulating the tip position with a piezoelectric xyz-system. A similar experi­ mental approach has already been described by Young et al. for the determination l of the macroscopic roughness of a surface. A number of experimental difficulties had to be solved by the IBM group until this conceptual simple microscopic method could be applied successfully with atomic resolution. Firstly, distance and scanning control of the tip have to be operated with sufficient precision to be sensitive to atomic structures. Secondly, sample holder and tunneling unit have to be designed in such a way that external vibrations do not influence the sample-tip distance and that thermal or other drift effects become small enough during measurement of one image.


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Editors and affiliations

  • H. Neddermeyer
    • 1
  1. 1.Institut für ExperimentalphysikRuhr-Universität BochumGermany

Bibliographic information

  • DOI
  • Copyright Information Springer Science+Business Media B.V. 1993
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-0-7923-2065-4
  • Online ISBN 978-94-011-1812-5
  • Series Print ISSN 0923-1749
  • Buy this book on publisher's site