Electron Beam Analysis of Materials

  • M. H. Loretto

Table of contents

  1. Front Matter
    Pages i-viii
  2. M. H. Loretto
    Pages 19-38
  3. M. H. Loretto
    Pages 65-112
  4. M. H. Loretto
    Pages 153-178
  5. Back Matter
    Pages 179-210

About this book


The examination of materials using electron beam techniques has developed continuously for over twenty years and there are now many different methods of extracting detailed structural and chemical information using electron beams. These techniques which include electron probe microanalysis, trans­ mission electron microscopy, Auger spectroscopy and scanning electron microscopy have, until recently, developed more or less independently of each other. Thus dedicated instruments designed to optimize the performance for a specific application have been available and correspondingly most of the available textbooks tend to have covered the theory and practice of an individual technique. There appears to be no doubt that dedicated instru­ ments taken together with the specialized textbooks will continue to be the appropriate approach for some problems. Nevertheless the underlying electron-specimen interactions are common to many techniques and in view of the fact that a range of hybrid instruments is now available it seems appropriate to provide a broad-based text for users of these electron beam facilities. The aim of the present book is therefore to provide, in a reasonably concise form, the material which will allow the practitioner of one or more of the individual techniques to appreciate and to make use of the type of information which can be obtained using other electron beam techniques.


X-ray crystal diffraction electron diffraction electron microscopy material microscopy spectroscopy

Authors and affiliations

  • M. H. Loretto
    • 1
  1. 1.University of BirminghamUK

Bibliographic information

  • DOI
  • Copyright Information Springer Science+Business Media B.V. 1984
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-94-010-8944-9
  • Online ISBN 978-94-009-5540-0
  • Buy this book on publisher's site