Testing and Diagnosis of VLSI and ULSI

  • Fabrizio Lombardi
  • Mariagiovanna Sami

Part of the NATO ASI Series book series (NSSE, volume 151)

Table of contents

  1. Front Matter
    Pages i-viii
  2. T. W. Williams
    Pages 1-31
  3. Vishwani D. Agrawal
    Pages 33-47
  4. Samiha Mourad, Edward J. McCluskey
    Pages 49-68
  5. Sudhakar M. Reddy, Sandip Kundu
    Pages 69-91
  6. Chin-Long Wey, Chwan-Chia Wu, Richard Saeks
    Pages 117-150
  7. Jon C. Muzio
    Pages 151-180
  8. Srinivas Devadas, Hi-Keung Tony Ma, Alberto Sangiovanni-Vincentelli
    Pages 181-245
  9. G. Musgrave
    Pages 247-255
  10. G. Saucier, M. Crastes de Paulet, F. Tiar
    Pages 273-286
  11. Vishwani D. Agrawal, Kwang Ting Cheng
    Pages 311-323
  12. F. Distante
    Pages 325-353
  13. F. Distante, M. G. Sami, R. Stefanelli
    Pages 355-381
  14. Fabrizio Lombardi, C-L Wey
    Pages 429-467
  15. J. P. Collin, B. Courtois
    Pages 469-506
  16. D. W. Ranasinghe
    Pages 509-526
  17. Back Matter
    Pages 527-533

About this book


This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.


CMOS Simulation VLSI diagnosis integrated circuit logic stability

Editors and affiliations

  • Fabrizio Lombardi
    • 1
    • 2
  • Mariagiovanna Sami
    • 3
  1. 1.Department of Electrical and Computer EngineeringUniversity of Colorado at BoulderBoulderUSA
  2. 2.Department of Computer ScienceTexas A&M UniversityUSA
  3. 3.Dipartimento di ElecttronicaPolitecnico di MilanoMilanoItaly

Bibliographic information

  • DOI
  • Copyright Information Springer Science+Business Media B.V. 1988
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-94-010-7134-5
  • Online ISBN 978-94-009-1417-9
  • Series Print ISSN 0168-132X
  • Buy this book on publisher's site