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Optics at the Nanometer Scale

Imaging and Storing with Photonic Near Fields

  • M. Nieto-Vesperinas
  • N. García

Part of the NATO ASI Series book series (NSSE, volume 319)

Table of contents

  1. Front Matter
    Pages i-ix
  2. Theory and Basic Principles

    1. J.-J. Greffet, R. Carminati
      Pages 1-26
    2. A. Madrazo, M. Nieto-Vesperinas, N. García
      Pages 27-40
    3. A. A. Maradudin, A. Mendoza-Suárez, E. R. Méndez, M. Nieto-Vesperinas
      Pages 41-61
    4. A. Castiaux, Ch. Girard, A. Dereux, X. Bouju, J. P. Vigneron
      Pages 95-104
  3. Experiments: Fundamentals and Applications

    1. D. Courjon, F. Baida, C. Bainier, D. Van Labeke
      Pages 105-117
    2. F. de Fornel, L. Salomon, J. C. Weeber, A. Rahmani, C. Pic, A. Dazzi
      Pages 119-130
    3. H. K. Wickramasinghe, Y. Martin, F. Zenhausern
      Pages 131-141
    4. M. Vaez-Iravani
      Pages 143-150
    5. B. Hecht, D. W. Pohl, L. Novotny
      Pages 151-161
    6. Richard Berndt
      Pages 175-180
    7. J. Massanell, N. García, A. Correia, A. Zlatkin, M. Sharonov, J. Przeslawski
      Pages 181-190
    8. N. Dubreuil, J. C. Knight, J. Hare, V. Lefevre-Seguin, J. M. Raimond, S. Haroche
      Pages 191-203
    9. O. H. Willemsen, O. F. J. Noordman, F. B. Segerink, A. G. T. Ruiter, M. H. P. Moers, N. F. Van Hulst
      Pages 223-233
    10. C. Durkan, I. V. Shvets
      Pages 257-261
  4. Back Matter
    Pages 297-301

About this book

Introduction

Optics at the Nanometer Scale: Imaging and Storing with Photonic Near Fields deals with the fundamentals of and the latest developments and applications of near-field optical microscopy, giving basic accounts of how and under what circumstances superresolution beyond the half- wavelength Rayleigh limit is achieved. Interferometric and fluorescence techniques are also described, leading to molecular and even atomic resolution using light. The storage of optical information at this level of resolution is also addressed.

Keywords

ALF Experiment Optical microscope Optics diffraction microscopy modeling spectroscopy

Editors and affiliations

  • M. Nieto-Vesperinas
    • 1
  • N. García
    • 2
  1. 1.Instituto de Ciencia de MaterialesConsejo Superior de Investigaciones CientíficasCantoblanco, MadridSpain
  2. 2.Laboratorio de Física de Sistemas PequeñosConsejo Superior de Investigaciones CientíficasCantoblanco, MadridSpain

Bibliographic information

  • DOI https://doi.org/10.1007/978-94-009-0247-3
  • Copyright Information Springer Science+Business Media B.V. 1996
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-94-010-6594-8
  • Online ISBN 978-94-009-0247-3
  • Series Print ISSN 0168-132X
  • Buy this book on publisher's site