Protecting Chips Against Hold Time Violations Due to Variability

  • Gustavo Neuberger
  • Gilson Wirth
  • Ricardo Reis

Table of contents

  1. Front Matter
    Pages i-xi
  2. Gustavo Neuberger, Gilson Wirth, Ricardo Reis
    Pages 1-3
  3. Gustavo Neuberger, Gilson Wirth, Ricardo Reis
    Pages 5-14
  4. Gustavo Neuberger, Gilson Wirth, Ricardo Reis
    Pages 15-19
  5. Gustavo Neuberger, Gilson Wirth, Ricardo Reis
    Pages 21-26
  6. Gustavo Neuberger, Gilson Wirth, Ricardo Reis
    Pages 27-32
  7. Gustavo Neuberger, Gilson Wirth, Ricardo Reis
    Pages 33-54
  8. Gustavo Neuberger, Gilson Wirth, Ricardo Reis
    Pages 55-68
  9. Gustavo Neuberger, Gilson Wirth, Ricardo Reis
    Pages 69-75
  10. Gustavo Neuberger, Gilson Wirth, Ricardo Reis
    Pages 77-89
  11. Gustavo Neuberger, Gilson Wirth, Ricardo Reis
    Pages 91-95
  12. Gustavo Neuberger, Gilson Wirth, Ricardo Reis
    Pages 97-102
  13. Gustavo Neuberger, Gilson Wirth, Ricardo Reis
    Pages 103-104
  14. Back Matter
    Pages 105-107

About this book

Introduction

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The consequences of variability to several aspects of circuit design, such as logic gates, storage elements, clock distribution, and any other that can be affected by process variations are discussed, with a key focus on storage elements.  The authors present a statistical analysis of the critical clock skew in several test paths, due to process variability in 130nm and 90nm CMOS technology. To facilitate an on-wafer test, a measurement circuit with a precision compatible to the speed of the technology is described.

 ·         Provides a comprehensive review of various reliability mechanisms;

·         Describes practical modeling and characterization techniques for reliability

·         Includes thorough presentation of robust design techniques for major VLSI design units

·         Promotes physical understanding with first-principle simulations

Keywords

Digital Circuit Design Efficiency Testing Variability

Authors and affiliations

  • Gustavo Neuberger
    • 1
  • Gilson Wirth
    • 2
  • Ricardo Reis
    • 3
  1. 1.Instituto de InformáticaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil
  2. 2.Instituto de InformáticaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil
  3. 3.Instituto de InformáticaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil

Bibliographic information

  • DOI https://doi.org/10.1007/978-94-007-2427-3
  • Copyright Information Springer Science+Business Media Dordrecht 2014
  • Publisher Name Springer, Dordrecht
  • eBook Packages Engineering
  • Print ISBN 978-94-007-2426-6
  • Online ISBN 978-94-007-2427-3
  • About this book