Book 2009

Test Pattern Generation using Boolean Proof Engines

ISBN: 978-90-481-2359-9 (Print) 978-90-481-2360-5 (Online)

Table of contents (11 chapters)

  1. Front Matter

    Pages i-xii

  2. No Access

    Chapter

    Pages 1-8

    Introduction

  3. No Access

    Chapter

    Pages 9-28

    Preliminaries

  4. No Access

    Chapter

    Pages 29-42

    Boolean Satisfiability

  5. No Access

    Chapter

    Pages 43-52

    SAT-Based ATPG

  6. No Access

    Chapter

    Pages 53-70

    Learning Techniques

  7. No Access

    Chapter

    Pages 71-87

    Multiple-Valued Logic

  8. No Access

    Chapter

    Pages 89-111

    Improved Circuit-to-CNF Conversion

  9. No Access

    Chapter

    Pages 113-117

    Branching Strategies

  10. No Access

    Chapter

    Pages 119-135

    Integration into Industrial Flow

  11. No Access

    Chapter

    Pages 137-171

    Delay Faults

  12. No Access

    Chapter

    Pages 173-175

    Summary and Outlook

  13. Back Matter

    Pages 177-192