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VLSI Design and Test for Systems Dependability

  • Shojiro Asai

Table of contents

  1. Front Matter
    Pages i-xvii
  2. Introduction

  3. VLSI Issues in Systems Dependability

    1. Front Matter
      Pages 55-55
    2. Eishi H. Ibe, Shusuke Yoshimoto, Masahiko Yoshimoto, Hiroshi Kawaguchi, Kazutoshi Kobayashi, Jun Furuta et al.
      Pages 57-127
    3. Makoto Nagata, Nobuyuki Yamasaki, Yusuke Kumura, Shuma Hagiwara, Masayuki Inaba
      Pages 129-161
    4. Hidetoshi Onodera, Yukiya Miura, Yasuo Sato, Seiji Kajihara, Toshinori Sato, Ken Yano et al.
      Pages 163-201
    5. Takashi Sato, Masanori Hashimoto, Shuhei Tanakamaru, Ken Takeuchi, Yasuo Sato, Seiji Kajihara et al.
      Pages 203-243
    6. Kazuo Tsubouchi, Fumiyuki Adachi, Suguru Kameda, Mizuki Motoyoshi, Akinori Taira, Noriharu Suematsu et al.
      Pages 245-324
    7. Hiroki Ishikuro, Tadahiro Kuroda, Atsutake Kosuge, Mitsumasa Koyanagi, Kang Wook Lee, Hiroyuki Hashimoto et al.
      Pages 325-350
    8. Tomohiro Yoneda, Yoshihiro Nakabo, Nobuyuki Yamasaki, Masayoshi Takasu, Masashi Imai, Suguru Kameda et al.
      Pages 351-393
    9. Takeshi Fujino, Daisuke Suzuki, Yohei Hori, Mitsuru Shiozaki, Masaya Yoshikawa, Toshiya Asai et al.
      Pages 395-437
    10. Masahiro Fujita, Koichiro Takayama, Takeshi Matsumoto, Kosuke Oshima, Satoshi Jo, Michiko Inoue et al.
      Pages 439-473
    11. Nobuyasu Kanekawa, Takashi Miyoshi, Masahiro Fujita, Takeshi Matsumoto, Hiroaki Yoshida, Satoshi Jo et al.
      Pages 475-509
  4. Design and Test of VLSI for Systems Dependability

    1. Front Matter
      Pages 511-511
    2. Hiroto Yasuura
      Pages 513-519
    3. Masahiro Fujita, Takeshi Matsumoto, Amir Masoud Gharehbaghi, Kosuke Oshima, Satoshi Jo, Hiroaki Yoshida et al.
      Pages 521-537
    4. Shigeru Oho, Yasuhiro Ito, Yasuo Sugure, Yohei Nakata, Hiroshi Kawaguchi, Masahiko Yoshimoto
      Pages 539-551
    5. Kazumi Hatayama, Seiji Kajihara, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue, Yasuo Sato et al.
      Pages 553-577
    6. Masahiko Yoshimoto, Yohei Nakata, Yuta Kimi, Hiroshi Kawaguchi, Makoto Nagata, Koji Nii
      Pages 579-591
    7. Shuhei Tanakamaru, Ken Takeuchi
      Pages 593-605
    8. Tomohiro Yoneda, Masashi Imai, Hiroshi Saito, Akira Mochizuki, Takahiro Hanyu, Kenji Kise et al.
      Pages 607-633
    9. Tadahiro Kuroda, Atsutake Kosuge
      Pages 645-657
    10. Kazuo Tsubouchi, Suguru Kameda, Hiroshi Oguma, Akinori Taira, Noriharu Suematsu, Tadashi Takagi
      Pages 675-691
    11. Nobuyuki Yamasaki, Hiroyuki Chishiro, Keigo Mizotani, Kikuo Wada
      Pages 693-707
    12. Masahiko Yoshimoto, Go Matsukawa, Yohei Nakata, Hiroshi Kawaguchi, Yasuo Sugure, Shigeru Oho
      Pages 709-718
    13. Mitsumasa Koyanagi, Hiroaki Kobayashi, Takafumi Aoki, Toshinori Sueyoshi, Tadashi Kamada
      Pages 719-733
    14. Hiroki Hihara, Akira Iwasaki, Masanori Hashimoto, Hiroyuki Ochi, Yukio Mitsuyama, Hidetoshi Onodera et al.
      Pages 735-750
    15. Daisuke Suzuki, Koichi Shimizu, Takeshi Fujino
      Pages 751-773
  5. Back Matter
    Pages 793-800

About this book

Introduction

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.

The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications.

This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

Keywords

CREST Program Error Correction Fault Tolerant Safety and Security Semiconductor Circuits Systems Dependability VLSI Design and Test Very Large Scale Integration

Editors and affiliations

  • Shojiro Asai
    • 1
  1. 1.Rigaku CorporationTokyoJapan

Bibliographic information

  • DOI https://doi.org/10.1007/978-4-431-56594-9
  • Copyright Information Springer Japan KK, part of Springer Nature 2019
  • Publisher Name Springer, Tokyo
  • eBook Packages Engineering
  • Print ISBN 978-4-431-56592-5
  • Online ISBN 978-4-431-56594-9
  • Buy this book on publisher's site