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Progress in Materials Analysis

Vol. 2

  • M. Grasserbauer
  • W. Wegscheider

Part of the Mikrochimica Acta Supplementum book series (MIKROCHIMICA, volume 11)

Table of contents

  1. Front Matter
    Pages I-X
  2. P. Beckmann, M. Kopnarski, H. Oechsner
    Pages 79-88
  3. A. Quentmeier, H. Bubert, R. P. H. Garten, H. J. Heinen, H. Puderbach, S. Storp
    Pages 89-102
  4. H. Puderbach, H. Bubert, A. Quentmeier, R. P. H. Garten, S. Storp
    Pages 103-112
  5. G. Pfennig, H. Moers, H. Klewe-Nebenius, R. Kaufmann, H. J. Ache
    Pages 113-124
  6. A. Lodding, H. Odelius, D. E. Clark, L. O. Werme
    Pages 145-161
  7. T. Richter, G. H. Frischat, G. Borchardt, S. Scherrer, S. Weber
    Pages 163-170
  8. G. Stingeder, M. Grasserbauer, U. Traxlmayr, E. Guerrero, H. Pötzl
    Pages 171-185
  9. Otto Brümmer, G. Dlubek
    Pages 187-204
  10. E. Wallura, J. Linke, K. Koizlik, H. Nickel
    Pages 343-350
  11. J. Fidler, P. Skalicky, F. Rothwarf
    Pages 371-380

About these proceedings

Introduction

Vol. 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti­ tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol­ ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals ............................................. .

Keywords

AES Aluminium Chromat In silico Nickel Phosphor bonding chemical analysis chemical bond corrosion electron element photoelectron spectroscopy spectroscopy system

Editors and affiliations

  • M. Grasserbauer
    • 1
  • W. Wegscheider
  1. 1.ViennaAustria

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-7091-8840-8
  • Copyright Information Springer-Verlag Vienna 1985
  • Publisher Name Springer, Vienna
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-211-81905-0
  • Online ISBN 978-3-7091-8840-8
  • Series Print ISSN 0076-8642
  • Buy this book on publisher's site