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Automatic Generation of Combinatorial Test Data

  • Jian Zhang
  • Zhiqiang Zhang
  • Feifei Ma
Book

Part of the SpringerBriefs in Computer Science book series (BRIEFSCOMPUTER)

Table of contents

  1. Front Matter
    Pages i-xi
  2. Jian Zhang, Zhiqiang Zhang, Feifei Ma
    Pages 1-16
  3. Jian Zhang, Zhiqiang Zhang, Feifei Ma
    Pages 17-25
  4. Jian Zhang, Zhiqiang Zhang, Feifei Ma
    Pages 27-39
  5. Jian Zhang, Zhiqiang Zhang, Feifei Ma
    Pages 41-49
  6. Jian Zhang, Zhiqiang Zhang, Feifei Ma
    Pages 51-60
  7. Jian Zhang, Zhiqiang Zhang, Feifei Ma
    Pages 61-78
  8. Jian Zhang, Zhiqiang Zhang, Feifei Ma
    Pages 79-83
  9. Jian Zhang, Zhiqiang Zhang, Feifei Ma
    Pages 85-90

About this book

Introduction

This book reviews the state-of-the-art in combinatorial testing, with particular emphasis on the automatic generation of test data. It describes the most commonly used approaches in this area - including algebraic construction, greedy methods, evolutionary computation, constraint solving and optimization - and explains major algorithms with examples. In addition, the book lists a number of test generation tools, as well as benchmarks and applications. Addressing a multidisciplinary topic, it will be of particular interest to researchers and professionals in the areas of software testing, combinatorics, constraint solving and evolutionary computation.

Keywords

Combinatorial testing Covering array Orthogonal array Test case generation

Authors and affiliations

  • Jian Zhang
    • 1
  • Zhiqiang Zhang
    • 2
  • Feifei Ma
    • 3
  1. 1.Institute of Software Chinese Academy of SciencesBeijingChina
  2. 2.Institute of Software Chinese Academy of SciencesBeijingChina
  3. 3.Institute of Software Chinese Academy of SciencesBeijingChina

Bibliographic information