Transmission Electron Microscopy

Physics of Image Formation and Microanalysis

  • Ludwig Reimer

Part of the Springer Series in Optical Sciences book series (SSOS, volume 36)

Table of contents

  1. Front Matter
    Pages I-XVI
  2. Ludwig Reimer
    Pages 1-15
  3. Ludwig Reimer
    Pages 17-43
  4. Ludwig Reimer
    Pages 45-77
  5. Ludwig Reimer
    Pages 143-196
  6. Ludwig Reimer
    Pages 275-329
  7. Ludwig Reimer
    Pages 331-361
  8. Ludwig Reimer
    Pages 463-494
  9. Back Matter
    Pages 495-587

About this book


Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fourth edition includes discussion of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.


crystal damage diffraction electron electron diffraction electron microscope electron microscopy holography microscopy scattering spectroscopy transmission electron microscopy X-ray

Authors and affiliations

  • Ludwig Reimer
    • 1
  1. 1.Physikalisches InstitutWestfälische Wilhelms-Universität MünsterMünsterGermany

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 1997
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-662-14826-6
  • Online ISBN 978-3-662-14824-2
  • Series Print ISSN 0342-4111
  • Series Online ISSN 1556-1534
  • Buy this book on publisher's site