SiC Power Materials

Devices and Applications

  • Zhe Chuan Feng

Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 73)

Table of contents

  1. Front Matter
    Pages I-XIX
  2. N. Ohtani, T. Fujimoto, M. Katsuno, H. Yashiro
    Pages 89-121
  3. E. Pernot, M. Pons, R. Madar
    Pages 123-160
  4. W. Lu, W. E. Collins, W. C. Mitchel
    Pages 303-343
  5. S. Dimitrijev, H. B. Harrison, P. Tanner, K. Y. Cheong, J. Han
    Pages 345-373
  6. Z. Luo, T. Chen, D. C. Sheridan, J. D. Cressler
    Pages 375-409
  7. N. B. Strokan, A. M. Ivanov, A. A. Lebedev
    Pages 411-445
  8. Back Matter
    Pages 447-452

About this book


In the 1950s Shockley predicted that SiC would quickly replace Si as a result of its superior material properties. In many ways he was right and today there is an active industry based on SiC, with new achievements being reported every year. This book reviews the progress achieved in SiC research and development, particularly over the past 10 years. It presents the essential properties of 3C-, 6H- and 4H-SiC polytypes including structural, electrical, optical, surface and interface properties; describes existing key SiC devices and also the challenges in materials growth and device fabrication of the 21st century. Overall it provides an up-to-date reference book suitable for a broad audience of newcomers, graduate students and engineers in industrial R&D.


Electronics Optoelectronics Oxidation Power devices Power semiconductors SiC Vibration development dynamics environment materials science modeling semiconductors

Editors and affiliations

  • Zhe Chuan Feng
    • 1
  1. 1.Graduate Institute of Electro-Optical Engineering, Department of Electrical EngineeringNational Taiwan UniversityTaipeiTaiwan, ROC

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 2004
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-05845-5
  • Online ISBN 978-3-662-09877-6
  • Series Print ISSN 0933-033X
  • Series Online ISSN 2196-2812
  • Buy this book on publisher's site